An annealing algorithm to correct positioning errors in ptychography von Maiden, A.M., Humphry, M.J., Sarahan, M.C., Kraus, B., Rodenburg, J.M.

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Quantitative electron phase imaging with high sensitivity and an unlimited field of view von Maiden, A. M., Sarahan, M. C., Stagg, M. D., Schramm, S. M., Humphry, M. J.

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Nano-scale Strain Mapping Using Advanced STEM with a Direct Electron Detector von Ozdol, V. B., Gammer, C., Sarahan, M.C., Minor, A. M.

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Nanoanalysis of a sub-nanometre reaction layer in a metal inserted high-k gate stack von Craven, A.J., Schaffer, B., Sarahan, M.C.

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Atomic resolution transmission imaging at 30keV via electron ptychography von Rodenburg, J.M., Maiden, A., Humphry, M., Kraus, B., Sarahan, M.

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Using Nion Swift for Data Collection, Analysis and Display von Meyer, C.E., Dellby, N., Dellby, Z., Lovejoy, T.C., Sarahan, M.C., Skone, G.S., Krivanek, O.L.

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Analysing interface reactions using EELS von Craven, A J, Schaffer, B, Sarahan, M C

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Electron Ptychography: Applications Of The Electron Wave Phase von Sarahan, M.C., Kraus, B., Humphry, M.J., Maiden, A.M., Rodenburg, J.M.

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High-Precision Chemical Analysis and Structural Determination of Functional Oxides by STEM-EELS von Kepaptsoglou, D.M., Azough, F., Ramasse, Q., Schaffer, B., Sarahan, M., Jackson, S., Freer, R.

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Defects in Two Dimensional Crystals: An Ultra-high Resolution Aberration-corrected Electron Microscopy Study von Alem, N., Ramasse, Q.M., Yazyev, O.V., Seabourne, C.R., Kisielowski, C.K., Hartel, P., Jiang, B., Erni, R., Erickson, K., Sarahan, M., Rossell, M., Scott, A., Louie, S., Zettl, A.

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Microstructure analyses and thermoelectric properties of Ag1−xPb18Sb1+yTe20 von Perlt, S., Höche, Th, Dadda, J., Müller, E., Bauer Pereira, P., Hermann, R., Sarahan, M., Pippel, E., Brydson, R.

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Evidence for boron diffusion into sub-stoichiometric MgO (001) barriers in CoFeB/MgO-based magnetic tunnel junctions von Harnchana, V., Hindmarch, A. T., Sarahan, M. C., Marrows, C. H., Brown, A. P., Brydson, R. M. D.

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Quantitative Crystallographic and Statistical Image Processing for Materials Science in Scanning Transmission Electron Microscopy von Ramasse, Q.M., Sarahan, M.C., Morgan, D.G., Browning, N.D.

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Microstructure analyses and thermoelectric properties of Ag1-xPb18Sb1+yTe20Ag1-xPb18Sb1+yTe20 von Perlt, S, Hoche, Th, Dadda, J, Mueller, E, Pereira, PBauer, Hermann, R, Sarahan, M, Pippel, E, Brydson, R

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Microstructure analyses and thermoelectric properties of Ag 1 − x Pb 18 Sb 1 + y Te 20 von Perlt, S., Höche, Th, Dadda, J., Müller, E., Bauer Pereira, P., Hermann, R., Sarahan, M., Pippel, E., Brydson, R.

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Hydrogen Analysis by Ultra-High Energy Resolution EELS von Cohen, H., Rez, P., Aoki, T., Crozier, P.A., Dellby, N., Dellby, Z., Gur, D., Lovejoy, T.C., March, K., Sarahan, M.C., Wolf, S.G., Krivanek, O.L.

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Microstructure analyses and thermoelectric properties of Ag1―xPb18Sb1+yTe20: Solid State Chemistry and Materials Science of Thermoelectric Materials von PERLT, S, HÖCHE, Th, DADDA, J, MÜLLER, E, BAUER PEREIRA, P, HERMANN, R, SARAHAN, M, PIPPEL, E, BRYDSON, R

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Microstructure analyses and thermoelectric properties of Ag{sub 1-x}Pb{sub 18}Sb{sub 1+y}Te{sub 20} von Perlt, S., Hoeche, Th, Dadda, J., Mueller, E., Bauer Pereira, P., Hermann, R., Faculte des Sciences, Universite de Liege, B-4000 Liege, Sarahan, M., Pippel, E., Brydson, R.

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Identification of Single Atoms Using Energy Dispersive X-ray Spectroscopy von Lovejoy, T.C., Corbin, G.J., Dellby, N., Szilagyi, Z.S., Krivanek, O.L., Falke, M., Kaeppel, A., Hahn, W., Rohde, M., Ramasse, Q., Godfrey, I., Kepaptsoglou, D.M., Sarahan, M.C., Shannon, M.D., Bleloch, A.L., Keyse, R.J., Zan, R.

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Experimental Study of Diabetes: Peculiarities of Simulation Techniques von Savitskii, I. V., Sarahan, V. M., Kuzmenko, I. A., Yakymchuk, N. V.

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