Characterization of V-shaped Defects in 4H-SiC Homoepitaxial Layers von Wu, Fangzhen, Wang, Huanhuan, Raghothamachar, Balaji, Dudley, Michael, Chung, Gil, Zhang, Jie, Thomas, Bernd, Sanchez, Edward K., Mueller, Stephan G., Hansen, Darren, Loboda, Mark J., Zhang, Lihua, Su, Dong, Kisslinger, Kim, Stach, Eric

Volltext

Measurement of Critical Thickness for the Formation of Interfacial Dislocations and Half Loop Arrays in 4H-SiC Epilayer via X-Ray Topography von Sanchez, Edward, Dudley, Michael, Raghothamachar, Balaji, Chung, Gil Yong, Mueller, Stephan G., Thomas, Bernd, Zhang, Jie, Wu, Fang Zhen, Hansen, Darren M., Wang, Huan Huan, Loboda, Mark J.

Volltext

A method to determine fault vectors in 4H-SiC from stacking sequences observed on high resolution transmission electron microscopy images von Wu, Fangzhen, Wang, Huanhuan, Raghothamachar, Balaji, Dudley, Michael, Mueller, Stephan G., Chung, Gil, Sanchez, Edward K., Hansen, Darren, Loboda, Mark J., Zhang, Lihua, Su, Dong, Kisslinger, Kim, Stach, Eric

Volltext

The Nucleation and Propagation of Threading Dislocations with C-Component of Burgers Vector in PVT-Grown 4H-SiC von Dudley, Michael, Sanchez, Edward, Sun, Shun, Mueller, Stephan G., Chung, Gil Yong, Hansen, Darren M., Wang, Huan Huan, Raghothamachar, Balaji, Wu, Fang Zhen, Byrapa, Sha Yan, Loboda, Mark J.

Volltext

Erratum: “A method to determine fault vectors in 4H-SiC from stacking sequences observed on high resolution transmission electron microscopy images” [J. Appl. Phys. 116 , 104905 (2... von Wu, Fangzhen, Wang, Huanhuan, Raghothamachar, Balaji, Dudley, Michael, Mueller, Stephan G., Chung, Gil, Sanchez, Edward K., Hansen, Darren, Loboda, Mark J., Zhang, Lihua, Su, Dong, Kisslinger, Kim, Stach, Eric

Volltext

Stacking Fault Formation via 2D Nucleation in PVT Grown 4H-SiC von Yang, Yu, Raghothamachar, Balaji, Chung, Gil Yong, Stach, Eric, Kisslinger, Kim, Wu, Fang Zhen, Hansen, Darren, Su, Dong, Sanchez, Edward, Dudley, Michael, Mueller, Stephan G., Guo, Jian Qiu, Wang, Huan Huan, Zhang, Li Hua, Loboda, Mark J.

Volltext

Study of V and Y Shape Frank-Type Stacking Faults Formation in 4H-SiC Epilayer von Yang, Yu, Raghothamachar, Balaji, Zhang, Jie, Mueller, Stephan G., Hansen, Darren M., Wu, Fang Zhen, Thomas, Bernd, Sanchez, Edward, Dudley, Michael, Wang, Huan Huan, Chung, Gil Yong, Loboda, Mark J., Byrapa, Sha Yan

Volltext

Quantitative Comparison Between Dislocation Densities in Offcut 4H-SiC Wafers Measured Using Synchrotron X-ray Topography and Molten KOH Etching von Wang, Huanhuan, Sun, Shun, Dudley, Michael, Byrappa, Shayan, Wu, Fangzhen, Raghothamachar, Balaji, Chung, Gil, Sanchez, Edward K., Mueller, Stephan G., Hansen, Darren, Loboda, Mark J.

Volltext

Studies of Relaxation Processes and Basal Plane Dislocations in CVD Grown Homoepitaxial Layers of 4H-SiC von Wang, Huanhuan, Wu, Fangzhen, Yang, Yu, Guo, Jianqiu, Raghothamachar, B, Dudley, Michael, Zhang, Jie, Chung, Gil, Thomas, Berndt, Sanchez, Edward K, Mueller, Stephan, Hansen, Darren, Loboda, Mark

Volltext

The Effect of 4H-SiC Substrate Surface Scratches on Chemical Vapor Deposition Grown Homo-Epitaxial Layer Quality von Chen, Yi, Dudley, Michael, Black, David R., Sanchez, Edward, Zhang, Ning

Volltext

Simulation of Grazing-Incidence Synchrotron White Beam X-ray Topographic Images of Micropipes in 4H-SiC and Determination of Their Dislocation Senses von Chen, Yi, Dudley, Michael, Sanchez, Edward K., MacMillan, Michael F.

Volltext

Sense Determination of c-Axis Screw Dislocations in 4H-SiC von Chen, Yi, Dudley, Michael, Sanchez, Edward, MacMillan, Mike F., Huang, Xian Rong, Dhanaraj, Govindhan

Volltext

Formation of thermal decomposition cavities in physical vapor transport of silicon carbide von Sanchez, Edward K., Kuhr, Thomas, Heydemann, Volker D., Snyder, David W., Rohrer, Gregory S., Skowronski, Marek

Volltext

Synchrotron X-Ray Topography Studies of the Propagation and Post-Growth Mutual Interaction of Threading Growth Dislocations with C-Component of Burgers Vector in PVT-Grown 4H-SiC von Dudley, Michael, Sanchez, Edward, Mueller, Stephan G., Drachev, Roman, Hansen, Darren M., Wang, Huan Huan, Raghothamachar, Balaji, Wu, Fang Zhen, Byrapa, Sha Yan, Loboda, Mark J.

Volltext

A method to determine fault vectors in 4H-SiC from stacking sequences observed on high resolution transmission electron microscopy images von Wu, Fangzhen, Wang, Huanhuan, Raghothamachar, Balaji, Dudley, Michael, Mueller, Stephan G., Chung, Gil, Sanchez, Edward K., Hansen, Darren, Loboda, Mark J., Zhang, Lihua, Su, Dong, Kisslinger, Kim, Stach, Eric

Volltext

Formation Mechanism of Stacking Faults in PVT 4H-SiC Created by Deflection of Threading Dislocations with Burgers Vector c+a von Dudley, Michael, Sanchez, Edward, Mueller, Stephan G., Choi, Gloria, Drachev, Roman, Hansen, Darren M., Wang, Huan Huan, Raghothamachar, Balaji, Wu, Fang Zhen, Byrapa, Sha Yan, Loboda, Mark J.

Volltext

Studies of the Origins of Half Loop Arrays and Interfacial Dislocations Observed in Homoepitaxial Layers of 4H-SiC von Dudley, Michael, Chung, Gil Yong, Wu, F., Guo, J.Q., Hansen, Darren, Yang, Yu, Sanchez, Edward, Venkatesh, T.A., Mueller, Stephan G., Thomas, Bernd, Zhang, Jie, Wang, H., Raghothamachar, Balaji, Loboda, Mark J.

Volltext

Characterization of V-shaped defects in 4H-SiC homoepitaxial layers von Zhang, Lihua, Su, Dong, Kisslinger, Kim, Stach, Eric, Chung, Gil, Zhang, Jie, Thomas, Bernd, Sanchez, Edward K, Mueller, Stephan G., Hansen, Darren, Loboda, Mark J., Wu, Fangzhen, Wang, Huanhuan, Raghothamachar, Balaji, Dudley, Michael

Volltext

Deflection of Threading Dislocations with Burgers Vector c/c+a Observed in 4H-SiC PVT–Grown Substrates with Associated Stacking Faults von Dudley, Michael, Sanchez, Edward, Sun, Shun, Mueller, Stephan G., Choi, Gloria, Drachev, Roman, Hansen, Darren M., Wang, Huan Huan, Raghothamachar, Balaji, Wu, Fang Zhen, Byrapa, Sha Yan, Loboda, Mark J.

Volltext

Characterization of Defects in SiC Substrates and Epilayers von Wang, Huanhuan, Wu, Fangzhen, Yang, Yu, Guo, Jianqiu, Raghothamachar, B, Dudley, Michael, Zhang, Jie, Chung, Gil, Thomas, Berndt, Sanchez, Edward K, Mueller, Stephan, Hansen, Darren, Loboda, Mark

Volltext