Punch-through currents in P+NP+ and N+PN+ sandwich structures—I von Lohstroh, J., Koomen, J.J.M., Van Zanten, A.T., Salters, R.H.W.

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Integrated circuit containing SRAM memory and method of testing same von R.H.W. SALTERS

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RANDOM ACCESS MEMORY DEVICE von R.H.W. SALTERS

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Method and circuit arrangement for memory error processing von A.M.H. DITEWIG, R.H.W. SALTERS, R. CUPPENS

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A 14 ns 256 K1 CMOS SRAM with multiple test modes von Voss, P.H., Pfennings, L.C.M.G., Phelan, C.G., O'Connell, C.M., Davies, T.J., Ontrop, H., Bell, S.A., Salters, R.H.W.

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SEMICONDUCTOR CHARGE STORAGE von J. LOHSTROH, R.H.W. SALTERS

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A 25-ns low-power full-CMOS 1-Mbit (128 K8) SRAM von Chu, S.T., Dikken, J., Hartgring, C.D., List, F.J., Raemaekers, J.G., Bells, S.A., Walsh, B., Salters, R.H.W.

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Punch-through currents in P+NP+ and N+PN+ sandwich structures—II von Lohstroh, J., Koomen, J.J.M., Van Zanten, A.T., Salters, R.H.W.

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Punch-through currents in P +NP + and N +PN + sandwich structures—I : Introduction and basic calculations von Lohstroh, J., Koomen, J.J.M., Van Zanten, A.T., Salters, R.H.W.

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Punch-through currents in P +NP + and N +PN + sandwich structures—II : General low-injection theory and measurements von Lohstroh, J., Koomen, J.J.M., Van Zanten, A.T., Salters, R.H.W.

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A 40-ns/100-pF low power full-CMOS 256 K (32 K/spl times/8) SRAM von Gubbels, W.C.H., Hartgring, C.D., Salters, R.H.W., Lammerts, J.A.M., Tooher, M.J., Hens, P.F.P.C., Bustiaens, J.J.J., Van Dijk, J.M.F., Sprokel, M.A.

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Memory-fast DRAMs for sharper TV von Salters, R.H.W.

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A 4096-B one-transistor per bit random-access memory with internal timing and low dissipation von Boonstra, L., Lambrechtse, C.W., Salters, R.H.W.

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RANDOM ACCESS JUNCTION FIELD-EFFECT FLOATING-GATE TRANSISTOR MEMORY von J. LOHSTROH, J.J.M. KOOMEN, R.H.W. SALTERS, A.T. VAN ZANTEN

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JUNCTION FIELD EFFECT TRANSISTOR RANDOM ACCESS MEMORY von C.M. HART, J. LOHSTROH, J.J.M. KOOMEN, R.H.W. SALTERS

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ICs going on a 3-V diet von Prince, B., Salters, R.H.W.

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