Interfacial electronic traps in surface controlled transistors von Cai, J., Sah, C.-T.

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Models and experiments on degradation of oxidized silicon von Sah, C.T.

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Positive oxide charge from hot hole injection during channel-hot-electron stress von Han, K.M., Sah, C.-T.

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Tunnel DCIV extraction of dopant-impurity concentration, oxide thickness, and length in the channel and extension regions of ultrathin gate-oxide MOS transistors von Jie, B.B., Chih-Tang Sah

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Complete electrical characterization of recombination properties of titanium in silicon von WANG, A. C, SAH, C. T

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Determination of trapped charge emission rates from nonexponential capacitance transients due to high trap densities in semiconductors von WANG, A. C, SAH, C. T

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Origin of Interface States and Oxide Charges Generated by Ionizing Radiation von Sah, C. T.

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New method for complete electrical characterization of recombination properties of traps in semiconductors von WANG, A. C, SAH, C. T

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Temperature dependence of surface recombination current in MOS transistors von Yih Wang, Neugroschel, A., Chih-Tang Sah

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New integral representations of circuit models and elements for the circuit technique for semiconductor device analysis von Sah, C.T.

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Profiles and annealing of thermally generated electron traps in boron-implanted phosphorus-doped silicon von JACKSON, D. B, SAH, C. T

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A study of oxide traps and interface states of the silicon-silicon dioxide interface von Stivers, A. R., Sah, C. T.

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Thermally generated electron traps in boron-implanted, phosphorus-doped silicon von JACKSON, D. B, SAH, C. T

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Characteristics of the metal-Oxide-semiconductor transistors von Sah, C.T.

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A new method for the determination of dopant and trap concentration profiles in semiconductors von Li, M-F, Sah, C T

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Hot carriers in silicon surface inversion layers von Hess, Karl, Sah, C. T.

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Thickness dependences of solar cell performance von Sah, C.T.

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A Model for Band-Gap Shrinkage in Semiconductors with Application to Silicon von Landsberg, P. T., Neugroschel, A., Lindholm, F. A., Sah, C. T.

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Reduction of solar cell efficiency by bulk defects across the back-surface-field junction von Sah, C. T., Yamakawa, K. A., Lutwack, R.

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Ion Transport Phenomena in Insulating Films von Snow, E. H., Grove, A. S., Deal, B. E., Sah, C. T.

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