Optical bandgap of semiconductor nanostructures: Methods for experimental data analysis von Raciti, R., Bahariqushchi, R., Summonte, C., Aydinli, A., Terrasi, A., Mirabella, S.

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A ternary–3D analysis of the optical properties of amorphous hydrogenated silicon–rich carbide von Summonte, C., Gaspari, F., Quaranta, S., Rizzoli, R., Centurioni, E., Canino, M., Polliotti, A.Y., Bianconi, M., Desalvo, A.

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Graphene as transparent conducting layer for high temperature thin film device applications von Veronese, G.P., Allegrezza, M., Canino, M., Centurioni, E., Ortolani, L., Rizzoli, R., Morandi, V., Summonte, C.

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TMAH-textured, a-Si/c-Si, heterojunction solar cells with 10% reflectance von Rosa, M., Allegrezza, M., Canino, M., Summonte, C., Desalvo, A.

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Electrical properties of silicon carbide/silicon rich carbide multilayers for photovoltaic applications von Perani, M., Cavalcoli, D., Canino, M., Allegrezza, M., Bellettato, M., Summonte, C.

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Tail absorption in the determination of optical constants of silicon rich carbides von Allegrezza, M., Gaspari, F., Canino, M., Bellettato, M., Desalvo, A., Summonte, C.

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Silicon nanocrystals in carbide matrix von Summonte, C., Allegrezza, M., Bellettato, M., Liscio, F., Canino, M., Desalvo, A., López-Vidrier, J., Hernández, S., López-Conesa, L., Estradé, S., Peiró, F., Garrido, B., Löper, P., Schnabel, M., Janz, S., Guerra, R., Ossicini, S.

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Absorption and emission of silicon nanocrystals embedded in SiC: Eliminating Fabry-Pérot interference von Schnabel, M., Summonte, C., Dyakov, S. A., Canino, M., López-Conesa, L., Löper, P., Janz, S., Wilshaw, P. R.

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Charge transport in nanocrystalline SiC with and without embedded Si nanocrystals von Schnabel, M., Canino, M., Kühnhold-Pospischil, S., López-Vidrier, J., Klugermann, T., Weiss, C., López-Conesa, L., Zschintzsch-Dias, M., Summonte, C., Löper, P., Janz, S., Wilshaw, P. R.

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Progress towards a high-performing a-Si:H-based electro-optic modulator von Rao, S, Coppola, G, Summonte, C, Della Corte, F G

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Erratum: “Influence of boron doping and hydrogen passivation on recombination of photoexcited charge carriers in silicon nanocrystal/SiC multilayers” [J. Appl. Phys. 114 , 073101 (... von Kořínek, M., Schnabel, M., Canino, M., Kozák, M., Trojánek, F., Salava, J., Löper, P., Janz, S., Summonte, C., Malý, P.

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Influence of boron doping and hydrogen passivation on recombination of photoexcited charge carriers in silicon nanocrystal/SiC multilayers von Kořínek, M., Schnabel, M., Canino, M., Kozák, M., Trojánek, F., Salava, J., Löper, P., Janz, S., Summonte, C., Malý, P.

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Boron doping of silicon rich carbides: Electrical properties von Summonte, C., Canino, M., Allegrezza, M., Bellettato, M., Desalvo, A., Shukla, R., Jain, I.P., Crupi, I., Milita, S., Ortolani, L., López-Conesa, L., Estradé, S., Peiró, F., Garrido, B.

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Optimization of ITO layers for applications in a-Si/c-Si heterojunction solar cells von Plá, J., Tamasi, M., Rizzoli, R., Losurdo, M., Centurioni, E., Summonte, C., Rubinelli, F.

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Wide band-gap silicon-carbon alloys deposited by very high frequency plasma enhanced chemical vapor deposition von Summonte, C., Rizzoli, R., Bianconi, M., Desalvo, A., Iencinella, D., Giorgis, F.

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Identification and tackling of a parasitic surface compound in SiC and Si-rich carbide films von Canino, M., Summonte, C., Allegrezza, M., Shukla, Rimpy, Jain, I.P., Bellettato, M., Desalvo, A., Mancarella, F., Sanmartin, M., Terrasi, A., Löper, P., Schnabel, M., Janz, S.

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Parametrization of optical properties of indium–tin–oxide thin films by spectroscopic ellipsometry: Substrate interfacial reactivity von Losurdo, M., Giangregorio, M., Capezzuto, P., Bruno, G., De Rosa, R., Roca, F., Summonte, C., Plá, J., Rizzoli, R.

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Influence of the sputtering system's vacuum level on the properties of indium tin oxide films von Zebaze Kana, M.G., Centurioni, E., Iencinella, D., Summonte, C.

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Local epitaxy from the silicon substrate in silicon–rich SiC during Si–nanocrystals formation von Canino, M., Balboni, R., Desalvo, A., Centurioni, E., Rizzoli, R., Bellettato, M., Summonte, C.

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Anatomy of μc-Si thin films by plasma enhanced chemical vapor deposition: An investigation by spectroscopic ellipsometry von Losurdo, M., Rizzoli, R., Summonte, C., Cicala, G., Capezzuto, P., Bruno, G.

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