Treffer 1 - 4 von 4 für Suche 'SUDWEEKS BRUCE D', Suchdauer: 0,29s Treffer weiter einschränken
  1. 1
    Method and apparatus for performing serial and parallel scan testing on an integrated circuit

    Method and apparatus for performing serial and parallel scan testing on an integrated circuit von SUDWEEKS, BRUCE D

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  2. 2
    Apparatus and method for testing non-deterministic device data

    Apparatus and method for testing non-deterministic device data von Hops, Jonathan M, Swing, Brian G, Pane, John R, Sudweeks, Bruce D, Phelps, Brian C, Kinslow, Jr, James E

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  3. 3
    Apparatus and method for testing non-deterministic device data

    Apparatus and method for testing non-deterministic device data von SUDWEEKS BRUCE D, PHELPS BRIAN C, PANE JOHN R, HOPS JONATHAN M, SWING BRIAN G, KINSLOW, JR. JAMES E

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  4. 4
    Apparatus and method for testing non-deterministic device data

    Apparatus and method for testing non-deterministic device data von SUDWEEKS BRUCE D, PHELPS BRIAN C, KINSLOW JAMES E.JR, PANE JOHN R, HOPS JONATHAN M, SWING BRIAN G

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