The contribution of grain boundary barriers to the electrical conductivity of titanium oxide thin films von Martin, Nicolas, Besnard, Aurélien, Sthal, Fabrice, Vaz, Filipe, Nouveau, Corinne

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AH Analyzer IEEE TIM paper 2024 von STHAL, Fabrice STHAL

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Comparison of an Affordable Open-Source Phase Noise Analyzer With Its Commercial Counterpart von De Visme, Philippe, Imbaud, Joel, Holme, Andrew, Sthal, Fabrice

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Carrier suppression system to measure phase noise of acoustic resonators with low motional resistance von Pokharel, A., Vaillant, E., Imbaud, J., Boy, J. J., Esnault, F. X., Sthal, F.

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Ultra-stable digitally controlled oven von Vorobyev, Nikolay, Imbaud, Joël, Abbé, Philippe, Sthal, Fabrice

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Fluctuation-dissipation theorem and 1/ f noise of bulk acoustic wave cavities von Sthal, F., Devel, M., Imbaud, J., Bourquin, R., Cibiel, G.

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2.44-GHz Surface Acoustic Wave Resonator Phase Noise Measured by Carrier Suppression Technique von Vaillant, E., Sthal, F., Imbaud, J., Soumann, V., Esnault, F.-X., Cibiel, G.

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Titanium oxynitride thin films sputter deposited by the reactive gas pulsing process von Chappé, Jean-Marie, Martin, Nicolas, Lintymer, Jan, Sthal, Fabrice, Terwagne, Guy, Takadoum, Jamal

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Phase Noise Measurements of AlN Contour-Mode Resonators With Carrier Suppression Technique von Vaillant, Etienne, Sthal, Fabrice, Imbaud, Joel, Soumann, Valerie, Abbe, Philippe, Arapan, Lilia, Esnault, Francois-Xavier, Cibiel, Gilles, Segovia-Fernandez, Jeronimo, Piazza, Gianluca

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Computation method for the short-term stability of quartz crystal resonators obtained from passive phase noise measures von Sthal, F., Imbaud, J., Vacheret, X., Salzenstein, P., Cibiel, G., Galliou, S.

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Study on the origin of 1/f noise in quartz resonators von Sthal, F, Devel, M, Imbaud, J, Bourquin, R, Ghosh, S, Cibiel, G

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Plateforme partenariale SUPMICROTECH-ENSMM : la pédagogie rencontre le monde de l’entreprise von Imbaud, Joël, Vernier, David, Haouchin, Karim, Cretin, Bernard, Sthal, Fabrice

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Volume dependence in handel's model of quartz crystal resonator noise von Sthal, Fabrice, Devel, Michel, Ghosh, Santunu, Imbaud, Joël, Cibiel, Gilles, Bourquin, Roger

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Objet Connecté Personnel : ObCP von Imbaud, Joël, Vernier, David, Abbé, Philippe, Sthal, Fabrice

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Frequency stability measurements of ultrastable BVA resonators and oscillators von SALZENSTEIN, P, KUNA, A, SOJDR, L, STHAL, F, CHOLLEY, N, LEFEBVRE, F

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Off grid charging station for electric bike von Fernández Martín, Daniel

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Reactive sputtering of TiOxNy coatings by the reactive gas pulsing process. Part I: Pattern and period of pulses von MARTIN, N, LINTYMER, J, GAVOILLE, J, CHAPPE, J. M, STHAL, F, TAKADOUM, J, VAZ, F, REBOUTA, L

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Langasite as a piezoelectric material for near-field microscopy resonant cantilevers von Douchet, Gabrielle, Sthal, Fabrice, Leblois, Thérèse, Bigler, Emmanuel

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The contribution of grain boundary barriers to the electrical conductivityof titanium oxide thin films von Martin, Nicolas, Besnard, Aurélien, Sthal, Fabrice, Vaz, Filipe, Nouveau, Corinne

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Temperature compensated cuts in LGT crystal microresonators using length extensional mode von Douchet, G., Sthal, F., Bigler, E., Bourquin, R.

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