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  1. 1
    EQUIPMENT FOR MEASURING ROUGHNESSES BELOW THE NANOMETRIC RANGE BY POLARIZATION INTERFEROMETRY

    EQUIPMENT FOR MEASURING ROUGHNESSES BELOW THE NANOMETRIC RANGE BY POLARIZATION INTERFEROMETRY von STEGARU F NEL, URSU DAN, AN U MAGDALENA

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  2. 2
    MODULAR SPECTROPHOTOMETRIC SYSTEM FOR SPECTRAL CHARACTERIZATION OF OPTICAL SYSTEMS COMPONENTS

    MODULAR SPECTROPHOTOMETRIC SYSTEM FOR SPECTRAL CHARACTERIZATION OF OPTICAL SYSTEMS COMPONENTS von STEGARU F NEL, URSU VASILE D NU, SOROHAN GEORGETA

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  3. 3
    SMART MODULAR CONFIGURABLE MULTI-SENSOR PASSIVE AND/OR ACTIVE VIEWING AND MONITORING SYSTEM - ATOS

    SMART MODULAR CONFIGURABLE MULTI-SENSOR PASSIVE AND/OR ACTIVE VIEWING AND MONITORING SYSTEM - ATOS von RANETE ROBERT, TRUFA ALEXANDRU, NEC ESCU VICTOR, MIRZU-D NIL MARINIC, STEGARU F NEL, URSU VASILE D NU, SOROHAN GEORGETA

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