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    Digital interface for fast, inline, statistical characterization of process, MOS device and circuit variations

    Digital interface for fast, inline, statistical characterization of process, MOS device and circuit variations von BHAVNAGARWALA AZEEZ JENNUDIN, RADENS CARL JOHN, KOSONOCKY STEPHEN V, STAWIASZ KEVIN GEOFFREY

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  2. 2
    Digital Interface for Fast, Inline, Statistical Characterization of Process, MOS Device and Circuit Variations

    Digital Interface for Fast, Inline, Statistical Characterization of Process, MOS Device and Circuit Variations von BHAVNAGARWALA AZEEZ JENNUDIN, RADENS CARL JOHN, KOSONOCKY STEPHEN V, STAWIASZ KEVIN GEOFFREY

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