Structural Changes in Nanometer-Thick Silicon-on-Insulator Films During High-Temperature Annealing von Tyschenko, I. E., Spesivtsev, E. V., Shklyaev, A. A., Popov, V. P.

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Mechanism of Transverse Charge Transfer in Thin Films of Hexagonal Boron Nitride von Islamov, D. R., Perevalov, T. V., Gismatulin, A. A., Azarov, I. A., Spesivtsev, E. V., Gritsenko, V. A.

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Anodic Oxidation of Hydrogen-Transferred Silicon-on-Insulator Layers von Tyschenko, I. E., Popov, I. V., Spesivtsev, E. V.

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The Use of Spectral Ellipsometry and Raman Spectroscopy in Screening Diagnostics of Colorectal Cancer von Kruchinin, V. N., Kruchinina, M. V., Prudnikova, Ya. I., Spesivtsev, E. V., Rykhlitskii, S. V., Volodin, V. A., Shekhovtsov, S. V., Pel’tek, S. E.

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Optical Properties of Ferroelectric Films HfxZryO2 and La:HfxZryO2 according to Ellipsometry Data von Kruchinin, V. N., Spesivtsev, E. V., Rykhlitsky, C. V., Gritsenko, V. A., Mehmood, F., Mikolajick, T., Schroeder, U.

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Optical Properties of Thin Films of Zinc Phthalocyanines Determined by Spectroscopic Ellipsometry von Kruchinin, V. N., Klyamer, D. D., Spesivtsev, E. V., Rykhlitskii, S. V., Basova, T. V.

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Optical Properties of the SiOx (x < 2) Thin Films Obtained by Hydrogen Plasma Processing of Thermal Silicon Dioxide von Kruchinin, V. N., Perevalov, T. V., Aliev, V. Sh, Iskhakzai, R. M. Kh, Spesivtsev, E. V., Gritsenko, V. A., Pustovarov, V. A.

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Holographic Recording in Micron Films Based on Polyfluorochalcones von Derevyashkin, S. V., Soboleva, E. A., Shelkovnikov, V. V., Spesivtsev, E. V.

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Methodological and instrumental problems in high-precision in situ ellipsometry diagnostics of the mercury cadmium telluride layer composition in molecular beam epitaxy von Shvets, V. A., Azarov, I. A., Spesivtsev, E. V., Rykhlitskii, S. V., Yakushev, M. V., Marin, D. V., Mikhailov, N. N., Kuzmin, V. D., Remesnik, V. G., Dvoretsky, S. A.

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ELLIPSOMETRY, RAMAN SPECTROSCOPY AND SOI- NANOWIRE BIOSENSOR IN DIAGNOSIS OF COLORECTALCANCER von Kruchinina, M. V., Prudnikova, Ya. I., Kurilovich, S. A., Gromov, A. A., Kruchinin, V. N., Atuchin, V. V., Naumova, O. V., Spesivtsev, E. V., Volodin, V. A., Peltek, S. E., Shuvalov, G. V., Generalov, V. M.

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Ellipsometry Equation for the Structure Substrate–Uniaxial Anisotropic Film with the Optical Axis in the Plane of Incidence von Shvets, V. A., Azarov, I. A., Spesivtsev, E. V.

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Compositionally tunable optical properties of hafnium titanium oxide films deposited by atomic layer deposition without intermediate surface hydroxylation von Lebedev, M.S., Kruchinin, V.N., Lebedeva, M.I., Spesivtsev, E.V.

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Properties of silicon nanolayers on insulator von Naumova, O.V., Vohmina, E.V., Gavrilova, T.A., Dudchenko, N.V., Nikolaev, D.V., Spesivtsev, E.V., Popov, V.P.

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Metastable phases in HxLi1-xTaO3 waveguide layers and pure LiTaO3 von Atuchin, V.V., Dimova-Malinovska, D., Grigorieva, T.I., Kalabin, I.E., Savatinova, I., Savova, I., Spesivtsev, E.V., Tonchev, S., Ziling, C.C.

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Conductance oscillations near bonded interface in the ultra thin silicon-on-insulator layers at room temperature von Naumova, O.V., Antonova, I.V., Popov, V.P., Sapognikova, N.V., Nastaushev, Yu.V., Spesivtsev, E.V., Aseev, A.L.

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In situ ellipsometry for control of Hg1−xCdxTe nanolayer structures and inhomogeneous layers during MBE growth von Shvets, V.A., Rykhlitski, S.V., Spesivtsev, E.V., Aulchenko, N.A., Mikhailov, N.N., Dvoretsky, S.A., Sidorov, Yu.G., Smirnov, R.N.

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Development of methods and instruments for optical ellipsometry at the Institute of Semiconductor Physics of the Siberian Branch of the Russian Academy of Sciences von Spesivtsev, E. V., Rykhlitskii, S. V., Shvets, V. A.

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Properties of extremely thin silicon layer in silicon-on-insulator structure formed by smart-cut technology von Popov, V.P, Antonova, I.V, Stas, V.F, Mironova, L.V, Gutakovskii, A.K, Spesivtsev, E.V, Mardegzhov, A.S, Franznusov, A.A, Feofanov, G.N

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Analysis of a static scheme of ellipsometric measurements von Shvets, V. A., Spesivtsev, E. V., Rykhlitskii, S. V.

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Anodization of nanoscale Si layers in silicon-on-insulator structures von Antonov, V. A., Spesivtsev, E. V., Tyschenko, I. E.

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