A new defect etch for polycrystalline silicon von SOPORI, B. L

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Hydrogen in silicon: A discussion of diffusion and passivation mechanisms von Sopori, B.L., Deng, X., Benner, J.P., Rohatgi, A., Sana, P., Estreicher, S.K., Park, Y.K., Roberson, M.A.

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Use of optical scattering to characterize dislocations in semiconductors von Sopori, B L

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The principle of dislocation analysis by coherent optical scattering from a defect-etched surface von SOPORI, B. L

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Fabrication of diode arrays for photovoltaic characterization of silicon substrates von SOPORI, B. L

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Atomic force microscopy study of FG-annealed and PECVD silicon nitride AR-coated silicon solar cells von Kishore, R., Moutinho, H.R., Sopori, B.L.

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Broadband very low reflectance surface von Sopori, B L

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A backside hydrogenation technique for defect passivation in silicon solar cells von SOPORI, B. L

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Principle of a new reflectometer for measuring dielectric film thickness on substrates of arbitrary surface characteristics von Sopori, B. L.

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A rapid wax mounting technique for cross-sectioning and angle polishing metallographic samples von SOPORI, B. L, HUGHES, J. L

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Measurement of high boron concentrations in silicon by infrared spectroscopy von SOPORI, B. L

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Observation of enhanced hydrogen diffusion in solar cell silicon von SOPORI, B. L, JONES, K, XIAO JUN DENG

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Optical diffraction technique for determination of crystal orientations von Sopori, B L

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Damage‐Free Polishing of Polycrystalline Silicon von Sopori, B. L., Nilsson, T., McClure, M.

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A comparison of gettering in single- and multicrystalline silicon for solar cells von Sopori, B.L., Jastrzebski, L., Tan, T.

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Characteristics of HEM silicon produced in a reusable crucible von Khattak, C.P., Schmid, F., Schubert, W.K., Cudzinovic, M., Sopori, B.L.

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Reflection characteristics of textured polycrystalline silicon substrates for solar cells von Sopori, B.L.

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Optimization of antireflection coating thickness for textured polycrystalline silicon solar cells — an experimental study von Sopori, B.L.

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Studies on the use of liquid surface passivation for lifetime measurements on good-quality silicon wafers von Devayajanam, S., Rupnowski, P., Shet, S., Sopori, B. L., Ravindra, N. M., Caskey, D., Chang, J., Covington, J.

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Detection of hairline cracks in textured silicon solar cells von Sopori, B L, Keeling, M C

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