METHOD OF ALUMINIUM AND SILICON OXIDES COMBINED THIN LAYERS PRODUCTION IN INTERFERENCE SYSTEMS OF LAYERS FOR 2,7 TILL 3,5 MICROMETER WAVELENGTH RANGE von SKODA VACLAV RNDR.,CS

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METHOD OF ALUMINIUM AND SILICON OXIDES COMBINED THIN LAYERS PRODUCTION IN INTERFERENCE SYSTEMS OF LAYERS FOR 2,7 TILL 3,5 MICROMETER WAVELENGTH RANGE von SKODA VACLAV RNDR.,CS

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SCINTILLATION DETECTOR OF LOW-ENERGETIC BETA RADIATION AND ELECTRONES WITH DIEELECTRIC LAYERS von KVAPIL JIRI DRSC.,CS, PERNER BOHUMIL CSC.,CS, AUTRATA RUDOLF CSC.,CS, SKODA VACLAV RNDR.,CS, BLAZEK KAREL ,CS, KVAPIL JOSEF CSC.,CS

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SCINTILLATION DETECTOR OF LOW-ENERGETIC BETA RADIATION AND ELECTRONES WITH DIEELECTRIC LAYERS von KVAPIL JIRI DRSC.,CS, PERNER BOHUMIL CSC.,CS, AUTRATA RUDOLF CSC.,CS, SKODA VACLAV RNDR.,CS, BLAZEK KAREL ,CS, KVAPIL JOSEF CSC.,CS

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PROCESS FOR MANUFACTURING MONOCRYSTALS FOR MAKING THIN SECTIONS WITH ADVANTAGE ORIENTATED DIRECTION OF LIGHT PASSAGE von JOHN VACLAV CSC.,CS, KVAPIL JIRI DRSC.,CS, PERNER BOHUMIL CSC.,CS, SKODA VACLAV RNDR.,CS, KVAPIL JOSEF CSC.,CS, KOSELJA MICHAL ,CS

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PROCESS FOR MANUFACTURING MONOCRYSTALS FOR MAKING THIN SECTIONS WITH ADVANTAGE ORIENTATED DIRECTION OF LIGHT PASSAGE von JOHN VACLAV CSC.,CS, KVAPIL JIRI DRSC.,CS, PERNER BOHUMIL CSC.,CS, SKODA VACLAV RNDR.,CS, KVAPIL JOSEF CSC.,CS, KOSELJA MICHAL ,CS

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