Impact of Low-Energy Proton Induced Upsets on Test Methods and Rate Predictions von Sierawski, B.D., Pellish, J.A., Reed, R.A., Schrimpf, R.D., Warren, K.M., Weller, R.A., Mendenhall, M.H., Black, J.D., Tipton, A.D., Xapsos, M.A., Baumann, R.C., Xiaowei Deng, Campola, M.J., Friendlich, M.R., Kim, H.S., Phan, A.M., Seidleck, C.M.

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Evaluating System-Level Radiation Hardness with Minimum Order Distributions von Champagne, Chloe A., Sierawski, Brian D.

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Ion-Induced Energy Pulse Mechanism for Single-Event Burnout in High-Voltage SiC Power MOSFETs and Junction Barrier Schottky Diodes von Ball, D. R., Hutson, J. M., Javanainen, A., Lauenstein, J.-M., Galloway, K. F., Johnson, R. A., Alles, M. L., Sternberg, A. L., Sierawski, B. D., Witulski, A. F., Reed, R. A., Schrimpf, R. D.

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Influence of Radiation Environment Variability on Cumulative Heavy-Ion-Induced Leakage Current in SiC Power Devices von Johnson, R. A., Witulski, A. F., Sierawski, B. D., Ball, D. R., Galloway, K. F., Sternberg, A. L., Reed, R. A., Schrimpf, R. D., Alles, M. L., Lauenstein, J. M., Hutson, J.M.

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A Confidence-Based Approach to Include Survivors in a Probabilistic TID Failure Assessment von Champagne, Chloe A., Sierawski, Brian D., Ladbury, Raymond L., Campola, Michael J., Fleetwood, Daniel M.

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Alpha Particle-Induced Persistent Effects in a COTS 3-D-Integrated CMOS Imager von Hu, M. D., McCurdy, M. W., Sierawski, B. D., Schrimpf, R. D., Reed, R. A., Alles, M. L.

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Contribution of Secondary Alpha Particles to Soft Error Rates in Space Systems von Cadena, Rick M., Warren, Kevin M., Dodds, Nathaniel A., Trippe, James M., Sierawski, Brian D., Ball, Dennis R., Reed, Robert A., Schrimpf, Ronald D.

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Predicting Muon-Induced SEU Rates for a 28-nm SRAM Using Protons and Heavy Ions to Calibrate the Sensitive Volume Model von Trippe, J. M., Reed, R. A., Austin, R. A., Sierawski, B. D., Massengill, L. W., Weller, R. A., Warren, K. M., Schrimpf, R. D., Narasimham, B., Bartz, B., Reed, D.

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Failure Estimates for SiC Power MOSFETs in Space Electronics von Galloway, Kenneth, Witulski, Arthur, Schrimpf, Ronald, Sternberg, Andrew, Ball, Dennis, Javanainen, Arto, Reed, Robert, Sierawski, Brian, Lauenstein, Jean-Marie

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Estimating Terrestrial Neutron-Induced SEB Cross Sections and FIT Rates for High-Voltage SiC Power MOSFETs von Ball, D. R., Sierawski, B. D., Galloway, K. F., Johnson, R. A., Alles, M. L., Sternberg, A. L., Witulski, A. F., Reed, R. A., Schrimpf, R. D., Javanainen, A., Lauenstein, J.-M

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Total Ionizing Dose Responses of 22-nm FDSOI and 14-nm Bulk FinFET Charge-Trap Transistors von Brewer, Rachel M., Zhang, En Xia, Gorchichko, Mariia, Wang, Peng Fei, Cox, Jonathan, Moran, Steven L., Ball, Dennis R., Sierawski, Brian D., Fleetwood, Daniel M., Schrimpf, Ronald D., Iyer, Subramanian S., Alles, Michael L.

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Low-Frequency and Random Telegraph Noise in 14-nm Bulk Si Charge-Trap Transistors von Gorchichko, Mariia, Zhang, En Xia, Reaz, Mahmud, Li, Kan, Wang, Peng Fei, Cao, Jingchen, Brewer, Rachel M., Schrimpf, Ronald D., Reed, Robert A., Sierawski, Brian D., Alles, Michael L., Cox, Jonathan, Moran, Steven L., Iyer, Subramanian S., Fleetwood, Daniel M.

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General Framework for Single Event Effects Rate Prediction in Microelectronics von Weller, R.A., Reed, R.A., Warren, K.M., Mendenhall, M.H., Sierawski, B.D., Schrimpf, R.D., Massengill, L.W.

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Incorporating Component-Level Testing into Bayesian Degradation Distributions to Estimate a Voltage Regulator's Radiation Failure Probabilities von Nederlander, Richard H., Witulski, Arthur F., Reed, Robert A., Karsai, Gabor, Ladbury, Ray L., Zhang, En Xia, Schrimpf, Ronald D., Ryder, Kaitlyn L., Campola, Michael J., Mahadevan, Nag, Austin, Rebekah A., Sierawski, Brian D.

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Monte Carlo Simulation of Single Event Effects von Weller, Robert A, Mendenhall, Marcus H, Reed, Robert A, Schrimpf, Ronald D, Warren, Kevin M, Sierawski, Brian D, Massengill, Lloyd W

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Probing the Single-Event Sensitivity of a COTS 3D-Integrated Imager with Alpha Particle Irradiation von Hu, M. D., Padgett, F., McCurdy, M. W., Sierawski, B. D., Schrimpf, R. D., Reed, R. A., Alles, M. L.

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A Confidence-Based Approach to Including Survivors in a Probabilistic TID Failure Assessment von Champagne, Chloe A., Sierawski, Brian D., Ladbury, Raymond L., Campola, Michael J., Fleetwood, Daniel M.

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Electron-Induced Single-Event Upsets in Static Random Access Memory von King, M. P., Reed, R. A., Weller, R. A., Mendenhall, M. H., Schrimpf, R. D., Sierawski, B. D., Sternberg, A. L., Narasimham, B., Wang, J. K., Pitta, E., Bartz, B., Reed, D., Monzel, C., Baumann, R. C., Deng, X., Pellish, J. A., Berg, M. D., Seidleck, C. M., Auden, E. C., Weeden-Wright, S. L., Gaspard, N. J., Zhang, C. X., Fleetwood, D. M.

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CRÈME: The 2011 Revision of the Cosmic Ray Effects on Micro-Electronics Code von Adams, J. H., Barghouty, A. F., Mendenhall, M. H., Reed, R. A., Sierawski, B. D., Warren, K. M., Watts, J. W., Weller, R. A.

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Impact of Ion Energy and Species on Single Event Effects Analysis von Reed, R.A., Weller, R.A., Mendenhall, M.H., Lauenstein, J.-M., Warren, K.M., Pellish, J.A., Schrimpf, R.D., Sierawski, B.D., Massengill, L.W., Dodd, P.E., Shaneyfelt, M.R., Felix, J.A., Schwank, J.R., Haddad, N.F., Lawrence, R.K., Bowman, J.H., Conde, R.

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