Treffer 1 - 6 von 6 für Suche 'SHYAM PRAVEEN VUDATHU', Suchdauer: 0,45s Treffer weiter einschränken
  1. 1
    Yield analysis via induction of process statistics into the design of MEMS and other microsystems

    Yield analysis via induction of process statistics into the design of MEMS and other microsystems von SHYAM PRAVEEN VUDATHU, KISHORE KUMAR DUGANAPALLI, LAUR, Rainer, KUBALINSKA, Dorota, BUNSE-GERSTNER, Angelika

    Veröffentlicht in Microsystem technologies

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  2. 2
    A Critical Enhancement in the Yield Analysis of Microsystems

    A Critical Enhancement in the Yield Analysis of Microsystems von Vudathu, S.P., Boning, D., Laur, R.


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  3. 3
    Design for Reliability (DfR) in MEMS using Worst-Case Methods

    Design for Reliability (DfR) in MEMS using Worst-Case Methods von Vudathu, Shyam Praveen, Lavu, Srikanth, Laur, Rainer


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  4. 4
    A Design Methodology for the Yield Enhancement of MEMS Designs with Respect to Process Induced Variations

    A Design Methodology for the Yield Enhancement of MEMS Designs with Respect to Process Induced Variations von Vudathu, S.P., Laur, R.


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  5. 5
    Parametric yield analysis on FEM based microsystem designs

    Parametric yield analysis on FEM based microsystem designs von Vudathu, S.P., Vemulapati, U.R., Duane Boning, Ramanolla, V., Laur, R., Silber, D.

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  6. 6
    Determination of Critical Parameters for Crosstalk Faults between On-chip Interconnects using Worst-Case Methods

    Determination of Critical Parameters for Crosstalk Faults between On-chip Interconnects using Worst-Case Methods von Vudathu, S.P., Duganapalli, K.K., Palit, A.K., Laur, R., Anheier, W.

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