Deep level trapped defect analysis in CH3NH3PbI3 perovskite solar cells by deep level transient spectroscopy von Heo, Sung, Seo, Gabseok, Lee, Yonghui, Lee, Dongwook, Seol, Minsu, Lee, Jooho, Park, Jong-Bong, Kim, Kihong, Yun, Dong-Jin, Kim, Yong Su, Shin, Jai Kwang, Ahn, Tae Kyu, Nazeeruddin, Mohammad Khaja

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Time-asymmetric loop around an exceptional point over the full optical communications band von Yoon, Jae Woong, Choi, Youngsun, Hahn, Choloong, Kim, Gunpyo, Song, Seok Ho, Yang, Ki-Yeon, Lee, Jeong Yub, Kim, Yongsung, Lee, Chang Seung, Shin, Jai Kwang, Lee, Hong-Seok, Berini, Pierre

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Exciton Recombination, Energy-, and Charge Transfer in Single- and Multilayer Quantum-Dot Films on Silver Plasmonic Resonators von Shin, Taeho, Cho, Kyung-Sang, Yun, Dong-Jin, Kim, Jinwoo, Li, Xiang-Shu, Moon, Eui-Seong, Baik, Chan-Wook, Il Kim, Sun, Kim, Miyoung, Choi, Jun Hee, Park, Gyeong-Su, Shin, Jai-Kwang, Hwang, Sungwoo, Jung, Tae-Sung

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Origins of High Performance and Degradation in the Mixed Perovskite Solar Cells von Heo, Sung, Seo, Gabseok, Lee, Yonghui, Seol, Minsu, Kim, Seong Heon, Yun, Dong‐Jin, Kim, Yongsu, Kim, Kihong, Lee, Junho, Lee, Jooho, Jeon, Woo Sung, Shin, Jai Kwang, Park, Jucheol, Lee, Dongwook, Nazeeruddin, Mohammad Khaja

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Self-Assembled Size-Tunable Microlight-Emitting Diodes Using Multiple Sapphire Nanomembranes von Oh, Jehong, Kim, Dongho, Yang, Duyoung, Hwang, Kyungwook, Hwang, Junsik, Kim, Jongmyeong, Lee, Seungmin, Ryu, Jungel, Park, Sohyeon, Shin, Jai-Kwang, Kim, Yongsung, Park, Yongjo, Yoon, Euijoon, Jang, Ho Won

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Strain-Driven Electronic Band Structure Modulation of Si Nanowires von Hong, Ki-Ha, Kim, Jongseob, Lee, Sung-Hoon, Shin, Jai Kwang

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Impact of Channel Hot Electrons on Current Collapse in AlGaN/GaN HEMTs von Hwang, Injun, Kim, Jongseob, Chong, Soogine, Choi, Hyun-Sik, Hwang, Sun-Kyu, Oh, Jaejoon, Shin, Jai Kwang, Chung, U-In

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The structural and electrical evolution of graphene by oxygen plasma-induced disorder von Kim, Dong Chul, Jeon, Dae-Young, Chung, Hyun-Jong, Woo, YunSung, Shin, Jai Kwang, Seo, Sunae

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Understanding the structural, electrical, and optical properties of monolayer h-phase RuO2 nanosheets: a combined experimental and computational study von Ko, Dong-Su, Lee, Woo-Jin, Sul, Soohwan, Jung, Changhoon, Yun, Dong-Jin, Kim, Hee-Goo, Son, Won-Joon, Chung, Jae Gwan, Jung, Doh Won, Kim, Se Yun, Kim, Jeongmin, Lee, Wooyoung, Kwak, Chan, Shin, Jai Kwang, Kim, Jung-Hwa, Roh, Jong Wook

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Wafer-scale alignment and integration of micro-light-emitting diodes using engineered van der Waals forces von Hwang, Junsik, Kim-Lee, Hyun-Joon, Hong, Seog Woo, Park, Joon-Yong, Kim, Dong Kyun, Kim, Dongho, Song, Sanghoon, Jeong, Jonghyun, Kim, Yongchan, Yeom, Min Jae, Yu, Min-chul, Kim, Joosung, Park, Younghwan, Shin, Dong-Chul, Kang, Sungjin, Shin, Jai-Kwang, Kim, Yongsung, Yoon, Euijoon, Lee, Hojin, Yoo, Geonwook, Jeong, Jaewook, Hwang, Kyungwook

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Direct evidence of flat band voltage shift for TiN/LaO or ZrO/SiO2 stack structure via work function depth profiling von Heo, Sung, Park, Hyoungsun, Ko, Dong-Su, Kim, Yong Su, Kyoung, Yong Koo, Lee, Hyung-Ik, Cho, Eunae, Lee, Hyo Sug, Park, Gyung-Su, Shin, Jai Kwang, Lee, Dongjin, Lee, Jieun, Jung, Kyoungho, Jeong, Moonyoung, Yamada, Satoru, Kang, Hee Jae, Choi, Byoung-Deog

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Effects of TMAH Treatment on Device Performance of Normally Off \hbox\hbox/\hbox MOSFET von Kim, Ki-Won, Jung, Sung-Dal, Kim, Dong-Seok, Kang, Hee-Sung, Im, Ki-Sik, Oh, Jae-Joon, Ha, Jong-Bong, Shin, Jai-Kwang, Lee, Jung-Hee

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High threshold voltage p-GaN gate power devices on 200 mm Si von Jongseob Kim, Sun-Kyu Hwang, Injun Hwang, Hyoji Choi, Soogine Chong, Hyun-Sik Choi, Woochul Jeon, Hyuk Soon Choi, Jun Yong Kim, Young Hwan Park, Kyung Yeon Kim, Jong-Bong Park, Jong-Bong Ha, Ki Yeol Park, Jaejoon Oh, Jai Kwang Shin, U-In Chung, In-Kyeong Yoo, Kinam Kim

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Dynamic model and electrical characteristics for RF-biased electronegative plasma sheath von Lee, Y.D., Oh, J.J., Jai Kwang Shin

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Effects of TMAH Treatment on Device Performance of Normally Off Al2O3/GaN MOSFET von KIM, Ki-Won, JUNG, Sung-Dal, KIM, Dong-Seok, KANG, Hee-Sung, IM, Ki-Sik, OH, Jae-Joon, HA, Jong-Bong, SHIN, Jai-Kwang, LEE, Jung-Hee

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Estimation of Short Circuit Capability of GaN HEMTs Using Transient Measurement von Hwang, Injun, Chong, Soogine, Shin, Dong-Chul, Hwang, Sun-Kyu, Park, Younghwan, Kim, Boram, Kim, Joonyong, Oh, Jaejoon, Park, Jun Hyuk, Yu, Min Chul, Jeon, Woochul, Shin, Jai Kwang, Kim, Jongseob

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Time‐Resolved Electroluminescence Study for the Effect of Charge Traps on the Luminescence Properties of Organic Light‐Emitting Diodes von Kang, Jooyoun, Son, Jung Bae, Kim, Gyeong Woo, Bae, Sohyeon, Min, Kyung Suk, Sul, Soohwan, Jeon, Woo Sung, Jang, Jaeduck, Park, Gyeong-Su, Shin, Jai Kwang, Kwon, Jang Hyuk, Kim, Seong Keun

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Transient Measurement of GaN HEMT Drift Region Potential in the High Power State von Hwang, Injun, Chong, Soogine, Park, Younghwan, Hwang, Sun-Kyu, Kim, Boram, Kim, Joonyong, Oh, Jaejoon, Park, Jun Hyuk, Shin, Dong-Chul, Yu, Min Chul, Shin, Jai Kwang, Kim, Jongseob

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Spontaneous pseudo-topological silicon quantization for redesigned Si-based Li-ion batteries von Ogata, Ken, Ko, Dong-Su, Jung, Changhoon, Lee, Jun-Ho, Sul, Soohwan, Kim, Hee-Goo, Seo, Jinah, Jang, Jihyun, Koh, Meiten, Kim, Kihong, Kim, Jin Hae, Jung, In-Sun, Park, Min Sik, Takei, Koichi, Saito, Shunsuke, Wakita, Shinya, Ito, Kimihiko, Kubo, Yoshimi, Uosaki, Kohei, Doo, Seokgwang, Han, SungSoo, Shin, Jai Kwang, Jeon, Seongho

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Degradation by water vapor of hydrogenated amorphous silicon oxynitride films grown at low temperature von Lee, Hyung-Ik, Park, Jong-Bong, Xianyu, Wenxu, Kim, Kihong, Chung, Jae Gwan, Kyoung, Yong Koo, Byun, Sunjung, Yang, Woo Young, Park, Yong Young, Kim, Seong Min, Cho, Eunae, Shin, Jai Kwang

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