Treffer 1 - 3 von 3 für Suche 'SHIN, Jeshik', Suchdauer: 0,34s Treffer weiter einschränken
  1. 1
    Extracting the Oxide Capacitance Using Inductance–Capacitance–Resistance Meter Measurement on Metal-Oxide-Semiconductor Capacitors

    Extracting the Oxide Capacitance Using Inductance–Capacitance–Resistance Meter Measurement on Metal-Oxide-Semiconductor Capacitors von Lee, Woohyung, Shin, Jeshik, Yang, Hyundoek, Hwang, Hyunsang


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  2. 2
    Electrical Characteristics of High-k Metal Oxide/SiO[sub 2] Stack Gate Dielectric Prepared by Reaction of Metal with SiO[sub 2]

    Electrical Characteristics of High-k Metal Oxide/SiO[sub 2] Stack Gate Dielectric Prepared by Reaction of Metal with SiO[sub 2] von Shin, Jeshik, Jeon, Sanghun, Hwang, Hyunsang


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  3. 3
    Electrical characteristics of high-k metal oxide/SiO2 stack gate dielectric prepared by reaction of metal with SiO2

    Electrical characteristics of high-k metal oxide/SiO2 stack gate dielectric prepared by reaction of metal with SiO2 von SHIN, Jeshik, JEON, Sanghun, HWANG, Hyunsang


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