Method and mechanism of vapor phase treatment–total reflection X-ray fluorescence for trace element analysis on silicon wafer surface von Takahara, Hikari, Mori, Yoshihiro, Shimazaki, Ayako, Gohshi, Yohichi

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Vapor phase treatment–total reflection X-ray fluorescence for trace elemental analysis of silicon wafer surface von Takahara, Hikari, Mori, Yoshihiro, Shibata, Harumi, Shimazaki, Ayako, Shabani, Mohammad B., Yamagami, Motoyuki, Yabumoto, Norikuni, Nishihagi, Kazuo, Gohshi, Yohichi

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Insufficient Confirmation of the Radiology Diagnostic Imaging Report based on Newspaper Articles von Shimazaki, Ayako, Tsushima, Yoshito

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新聞報道からみた画像診断報告書の確認不足問題 von 島崎, 綾子, 対馬, 義人

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Analysis of Low Metallic Contamination on Silicon Wafer Surfaces by Vapor-Phase Treatment and Total Reflection X-ray Fluorescence Analysis von Shimazaki, Ayako, Miyazaki, Kunihiro, Matsumura, Tsuyoshi, Ito, Shoko

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Metallic Contamination Control in Leading-Edge ULSI Manufacturing von Iwase, Masao, Yoshimura, Reiko, Tada, Tsukasa, Sakurai, Hiroki, Shimazaki, Ayako

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Effect of Intravenous Acetaminophen and Flurbiprofen on Postoperative Pain after Lumbar Disc Surgery von Ono, Maki, Terao, Yoshiaki, Komatsu, Yuya, Shimazaki, Ayako, Oji, Natsuko, Oji, Makito

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High-sensitivity total reflection X-ray fluorescence spectroscopy of silicon wafers using synchrotron radiation von LADERMAN, S. S, FISCHER-COLBRIE, A, SHIMAZAKI, A, MIYAZAKI, K, BRENNAN, S, TAKAKURA, N, PIANETTA, P, KORTRIGHT, B

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Guest Editorial Special Section on Materials-Related Manufacturing Issues in the Nanochip Era von Singh, R., Tyagi, S., Shimazaki, A., Claeys, C.L., Chen, S.-H., Thakur, R.P.S.

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Evaluation of Ultratrace Metallic Elements in Poly-SiGe Thin Films von Yamada, Yuji, Kozuka, Shoji, Takenaka, Miyuki, Shimazaki, Ayako

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Analytical Chemistry represented by "super" and "ultra". Determination of ultratrace phosphorus and titanium on silicon wafer surface by high resolution ICP-MS von YAMADA, Yuji, TACHIBE, Tetsuya, SHIMAZAKI, Ayako, TAKENAKA, Miyuki, KOZUKA, Shoji

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Determination of ultratrace phosphorus and titanium on silicon wafer surface by high resolution ICP-MS von YAMADA, Yuji, TACHIBE, Tetsuya, SHIMAZAKI, Ayako, TAKENAKA, Miyuki, KOZUKA, Shoji

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Method for analyzing an impurity on a semiconductor substrate von SHIMAZAKI, AYAKO

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METHOD FOR ANALYSIS OF IMPURITY OF SEMICONDUCTOR SUBSTRATE von SHIMAZAKI, AYAKO

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METHOD AND DEVICE FOR EVALUATING IMPURITY IN AIR von SHIMAZAKI AYAKO

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Method for analying an impurity on a semiconductor substrate von SHIMAZAKI, AYAKO

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Method for analyzing an impurity on a semiconductor substrate von SHIMAZAKI, AYAKO

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Dyeing of Silk with Acid Dye Mixtures von Nakagaki, Masayuki, Shimazaki, Ayako, Furumiya, Mariko

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IMPURITY ANALYZING METHOD OF SEMICONDUCTOR SUBSTRATE von SHIMAZAKI AYAKO

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Method for analyzing an impurity on a semiconductor substrate von SHIMAZAKI, AYAKO

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