Highly In‐Plane Optical and Electrical Anisotropy of 2D Germanium Arsenide von Yang, Shengxue, Yang, Yanhan, Wu, Minghui, Hu, Chunguang, Shen, Wanfu, Gong, Yongji, Huang, Li, Jiang, Chengbao, Zhang, Yongzhe, Ajayan, Pulickel M.

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In-Plane Optical Anisotropy and Linear Dichroism in Low-Symmetry Layered TlSe von Yang, Shengxue, Hu, Chunguang, Wu, Minghui, Shen, Wanfu, Tongay, Sefaattin, Wu, Kedi, Wei, Bin, Sun, Zhaoyang, Jiang, Chengbao, Huang, Li, Wang, Zhongchang

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Visible to mid-infrared giant in-plane optical anisotropy in ternary van der Waals crystals von Feng, Yanze, Chen, Runkun, He, Junbo, Qi, Liujian, Zhang, Yanan, Sun, Tian, Zhu, Xudan, Liu, Weiming, Ma, Weiliang, Shen, Wanfu, Hu, Chunguang, Sun, Xiaojuan, Li, Dabing, Zhang, Rongjun, Li, Peining, Li, Shaojuan

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Remarkable electronic and optical anisotropy of layered 1T’-WTe2 2D materials von Zhang Qiankun, Zhang Rongjie, Chen Jiancui, Shen Wanfu, An Chunhua, Hu, Xiaodong, Dong Mingli, Liu, Jing, Zhu Lianqing

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Direct Observation of Crystalline Distortions in Mechanically Exfoliated Low-symmetric 2D Materials von Lu, Huoqing, Shen, Wanfu, Wang, Haile, Liu, Jiabao, Yu, Yu, Ma, Guoteng, Liu, Hongguang, Wu, Sen, Hu, Chunguang

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Surface and Subsurface Quality Assessment of Polished Lu2O3 Single Crystal Using Quasi-Brewster Angle Technique von Yao, Chengyuan, Shen, Wanfu, Hu, Xiaodong, Hu, Chunguang

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Polarization‐sensitive and wide‐spectrum photovoltaic detector based on quasi‐1D ZrGeTe4 nanoribbon von Bai, Ruixue, Xiong, Tao, Zhou, Jinshu, Liu, Yue‐Yang, Shen, Wanfu, Hu, Chunguang, Yan, Faguang, Wang, Kaiyou, Wei, Dahai, Li, Jingbo, Yang, Juehan, Wei, Zhongming

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Black Phosphorus Nano-Polarizer with High Extinction Ratio in Visible and Near-Infrared Regime von Shen, Wanfu, Hu, Chunguang, Huo, Shuchun, Sun, Zhaoyang, Fan, Guofang, Liu, Jing, Sun, Lidong, Hu, Xiaotang

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Optical properties of large-size and damage-free polished Lu2O3 single crystal covering the ultraviolet-visible-and near-infrared (UV–VIS–NIR) spectral region von Yao, Chengyuan, Shen, Wanfu, Hu, Xiaodong, Hu, Chunguang

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Evaluation of the surface and subsurface evolution of single-crystal yttrium aluminum garnet during polishing von Yao, Chengyuan, Shen, Wanfu, Hu, Xiaodong, Hu, Chunguang

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In-Plane Optical and Electrical Anisotropy of 2D Black Arsenic von Zhong, Mianzeng, Meng, Haotong, Liu, Sijie, Yang, Huai, Shen, Wanfu, Hu, Chunguang, Yang, Juehan, Ren, Zhihui, Li, Bo, Liu, Yunyan, He, Jun, Xia, Qinglin, Li, Jingbo, Wei, Zhongming

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Synthesis and ellipsometric characterizations of large-scale MoS2 sub-monolayer von Ma, Guoteng, Shen, Wanfu, Sanchez, Soy Daniel, Yu, Yu, Hu, Chunguang, Sun, Lidong

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Growth of singly orientated MoSe2 monolayer on Al2O3(112¯0) von Huang, Yufeng, Wei, Yaxu, Li, Yanning, Hu, Chunguang, Shen, Wanfu, Zhang, Kun, Xu, Zongwei, Sun, Lidong

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Intrinsic Linear Dichroism of Organic Single Crystals toward High‐Performance Polarization‐Sensitive Photodetectors von Wang, Tianyu, Zhao, Kai, Wang, Pan, Shen, Wanfu, Gao, Haikuo, Qin, Zhengsheng, Wang, Yongshuai, Li, Chunlei, Deng, Huixiong, Hu, Chunguang, Jiang, Lang, Dong, Huanli, Wei, Zhongming, Li, Liqiang, Hu, Wenping

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Directly Evaluating the Optical Anisotropy of Few‐Layered Black Phosphorus during Ambient Oxidization von Shen, Wanfu, Sun, Zhaoyang, Huo, Shuchun, Hu, Chunguang

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Excitons Enabled Topological Phase Singularity in a Single Atomic Layer von Ma, Guoteng, Shen, Wanfu, Sanchez, Daniel Soy, Yu, Yu, Wang, Han, Sun, Lidong, Wang, Xinran, Hu, Chunguang

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Using high numerical aperture objective lens in micro-reflectance difference spectrometer von Shen, Wanfu, Hu, Chunguang, Li, Shuai, Hu, Xiaotang

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Birefringence and Dichroism in Quasi‐1D Transition Metal Trichalcogenides: Direct Experimental Investigation von Hou, Shijun, Guo, Zhengfeng, Yang, Juehan, Liu, Yue‐Yang, Shen, Wanfu, Hu, Chunguang, Liu, Shiyuan, Gu, Honggang, Wei, Zhongming

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Strain and Interference Synergistically Modulated Optical and Electrical Properties in ReS2/Graphene Heterojunction Bubbles von Chen, Yujia, Wang, Yunkun, Shen, Wanfu, Wu, Minghui, Li, Bin, Zhang, Qu, Liu, Shuai, Hu, Chunguang, Yang, Shengxue, Gao, Yunan, Jiang, Chengbao

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Imaging layer thickness of large-area graphene using reference-aided optical differential reflection technique von Hu, Chunguang, Wang, Hao, Shen, Yongtao, Huo, Shuchun, Shen, Wanfu, Hu, Xiaodong, Hu, Xiaotang

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