Resolving the time when an electron exits a tunnelling barrier von Shafir, Dror, Soifer, Hadas, Bruner, Barry D., Dagan, Michal, Mairesse, Yann, Patchkovskii, Serguei, Ivanov, Misha Yu, Smirnova, Olga, Dudovich, Nirit

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Subcycle control of electron-electron correlation in double ionization von Zhang, Li, Xie, Xinhua, Roither, Stefan, Zhou, Yueming, Lu, Peixiang, Kartashov, Daniil, Schöffler, Markus, Shafir, Dror, Corkum, Paul B, Baltuška, Andrius, Staudte, André, Kitzler, Markus

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Multidimensional high harmonic spectroscopy von Bruner, Barry D, Soifer, Hadas, Shafir, Dror, Serbinenko, Valeria, Smirnova, Olga, Dudovich, Nirit

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Spatio-spectral analysis of ionization times in high-harmonic generation von Soifer, Hadas, Dagan, Michal, Shafir, Dror, Bruner, Barry D., Ivanov, Misha Yu, Serbinenko, Valeria, Barth, Ingo, Smirnova, Olga, Dudovich, Nirit

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Resolving the time when an electron exits a tunnelling barrier von Shafir, Dror, Soifer, Hadas, Bruner, Barry D, Dagan, Michal, Mairesse, Yann, Patchkovskii, Serguei, Ivanov, Misha Yu, Smirnova, Olga, Dudovich, Nirit

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Laser-sub-cycle two-dimensional electron-momentum mapping using orthogonal two-color fields von Zhang, Li, Xie, Xinhua, Roither, Stefan, Kartashov, Daniil, Wang, YanLan, Wang, ChuanLiang, Schöffler, Markus, Shafir, Dror, Corkum, Paul B., Baltuška, Andrius, Ivanov, Igor, Kheifets, Anatoli, Liu, XiaoJun, Staudte, André, Kitzler, Markus

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OPTICAL PHASE MEASUREMENT METHOD AND SYSTEM von BARAK, Gilad, GROSSMAN, DANNY, SHAFIR, Dror, HAINICK, Yanir, BERLATZKY, YOAV

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Spatial control of electronic wave packets with attosecond precision von Zhang, Li, Xie, Xinhua, Roither, Stefan, Kartashov, Daniil, Schöffler, Markus, Shafir, Dror, Corkum, Paul, Baltuška, Andrius, Staudte, André, Kitzler, Markus

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Optical phase measurement system and method von Barak, Gilad, Hainick, Yanir, Gov, Shahar, Shafir, Dror

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A method for autofocusing an interferometric optical system von Dror Shafir, Omry Blum

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OPTICAL PHASE MEASUREMENT SYSTEM AND METHOD von BARAK, Gilad, SHAFIR, Dror, Gov, Shahar, HAINICK, Yanir

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METHOD AND SYSTEM FOR OPTICAL CHARACTERIZATION OF PATTERNED SAMPLES von YACHINI, Michal Haim, BARAK, Gilad, SHAFIR, Dror, WOLFLING, Shay, SENDELBACH, Matthew, BOZDOG, Cornel

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METROLOGY TECHNIQUE FOR SEMICONDUCTOR DEVICES von Szafranek, Dana, Heilpern, Tal, Gorohovsky, Zvi, Ofek, Jacob, BARAK, Gilad, SHAFIR, Dror, Peimer, Daphna, Ferber, Smadar

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Optical phase measurement system and method von Barak, Gilad, Hainick, Yanir, Gov, Shahar, Shafir, Dror

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Method and system for optical characterization of patterned samples von Barak, Gilad, Yachini, Michal Haim, Bozdog, Cornel, Wolfling, Shay, Shafir, Dror, Sendelbach, Matthew

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Time-domain optical metrology and inspection of semiconductor devices von SHAFIR Dror, SZAFRANEK Dana, FERBER Smadar, HEILPERN Tal, GOROHOVSKY Zvi, PEIMER Daphna, OFEK Jacob, BARAK Gilad

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OPTICAL PHASE MEASUREMENT METHOD AND SYSTEM von GROSSMAN, Danny, BERLATZKY, Yoav, BARAK, Gilad, SHAFIR, Dror, HAINICK, Yanir

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Optical phase measurement method and system von Barak, Gilad, Hainick, Yanir, Shafir, Dror, Grossman, Danny, Berlatzky, Yoav

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Optical critical dimension metrology von Barak, Gilad, Shafir, Dror, Grossman, Danny

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TIME-DOMAIN OPTICAL METROLOGY AND INSPECTION OF SEMICONDUCTOR DEVICES von HEILPERN, Tal, PEIMER, Daphna, BARAK, Gilad, SHAFIR, Dror, GOROHOVSKY, Zvi, SZAFRANEK, Dana, OFEK, Jacob, FERBER, Smadar

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