Intermixing induced anisotropy variations in CoB-based chiral multilayer films von Tan, H K, Lim, Royston J J, Seng, H L, Shanmugam, J, Ko, H Y Y, Cheng, X M, Putra, V, Xing, Z X, Soumyanarayanan, Anjan, Ho, Pin

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Effects of lift-off and strain relaxation on optical properties of InGaN/GaN blue LED grown on 150 mm diameter Si (111) substrate von LIU, H. F, SENG, H. L, TENG, J. H, CHUA, S. J, CHI, D. Z

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Yb-doped WO3 photocatalysts for water oxidation with visible light von Liew, S.L., Zhang, Z., Goh, T.W. Glenn, Subramanian, G.S., Seng, H.L. Debbie, Hor, T.S. Andy, Luo, H.-K., Chi, D.Z.

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Solution-Printable PEDOT Solid-Contact for Nitrate-Selective Electrodes: Enhanced Selectivity from Anion Dopant Exchange von Neo, Zhi Hao, Seah, Georgina E. K. K., Ng, Shi Hoe, Safanama, Dorsasadat, Seng, Debbie H. L., Goh, Shermin S.

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Proton beam writing of passive waveguides in PMMA von Sum, T.C., Bettiol, A.A., Seng, H.L., Rajta, I., van Kan, J.A., Watt, F.

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Mechanical, tribological and corrosion properties of CrBN films deposited by combined direct current and radio frequency magnetron sputtering von Jahodova, Vera, Ding, Xing-zhao, Seng, Debbie H.L., Gulbinski, W., Louda, P.

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The impact of layer thickness of IMP-deposited tantalum nitride films on integrity of Cu/TaN/SiO2/Si multilayer structure von KHIN MAUNG LATT, LEE, Y. K, LI, S, OSIPOWICZ, T, SENG, H. L

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Via resistance reduction using cool PVD-Ta processing von SEET, C. S, ZHANG, B. C, TAN, J. B, YONG, Clare, LIEW, S. L, LI, K, HSIA, L. C, SENG, H. L, OSIPOSWICZ, T, SUDIJONO, J, HUA CHUN ZENG

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Ge nanocrystals in lanthanide-based Lu2O3 high-k dielectric for nonvolatile memory applications von Chan, M. Y., Lee, P. S., Ho, V., Seng, H. L.

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Diffusion barrier properties of ionized metal plasma deposited tantalum nitride thin films between copper and silicon dioxide von KHIN MAUNG LATT, LEE, Y. K, SENG, H. L, OSIPOWICZ, T

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Atomic layer deposited (TiO2)x(Al2O3)1−x/In0.53Ga0.47As gate stacks for III-V based metal-oxide-semiconductor field-effect transistor applications von Mahata, C., Mallik, S., Das, T., Maiti, C. K., Dalapati, G. K., Tan, C. C., Chia, C. K., Gao, H., Kumar, M. K., Chiam, S. Y., Tan, H. R., Seng, H. L., Chi, D. Z., Miranda, E.

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Predicting Species Diversity in Tropical Forests von Plotkin, Joshua B., Potts, Matthew D., Yu, Douglas W., Bunyavejchewin, Sarayudh, Condit, Richard, Foster, Robin, Hubbell, Stephen, LaFrankie, James, Manokaran, N., Seng, Lee Hua, Sukumar, Raman, Nowak, Martin A., Ashton, Peter S.

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Impact of severe drought associated with the 1997–1998 El Niño in a tropical forest in Sarawak von Nakagawa, Michiko, Tanaka, Kenta, Nakashizuka, Tohru, Ohkubo, Tatsuhiro, Kato, Tsuyoshi, Maeda, Teizou, Sato, Kaori, Miguchi, Hideo, Nagamasu, Hidetoshi, Ogino, Kazuhiko, Teo, Stephen, Hamid, Abang Abudul, Seng, Lee Hua

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Study on SiNx passivated Cu/Ta/SiO2/Si multilayer structure von LATT, K. M, PARK, H. S, SENG, H. L, OSIPOWICZ, T, LEE, Y. K

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High-resolution channeling contrast microscopy of compositionally graded Si1−XGeX layers von Seng, H.L., Osipowicz, T., Sum, T.C., Breese, M.B.H., Watt, F., Tok, E.S., Zhang, J.

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Effect of the silicon nitride passivation layer on the Cu/Ta/SiO2/Si multi-layer structure von KHIN MAUNG LATT, PARK, H. S, SENG, H. L, OSIPOWICZ, T, LEE, Y. K, LI, S

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Analysis of oxide formation induced by UV laser coloration of stainless steel von Li, Z.L., Zheng, H.Y., Teh, K.M., Liu, Y.C., Lim, G.C., Seng, H.L., Yakovlev, N.L.

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Characterisation of Ge nanocrystals in co-sputtered Ge+SiO2 system using raman spectroscopy, RBS and TEM von HO, Y. W, NG, V, CHOI, W. K, NG, S. P, OSIPOWICZ, T, SENG, H. L, TJUI, W. W, LI, K

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Suppression of Ge-based defects and auto-doping of p-type epitaxial GaAs by employing Al0.3Ga0.7As bi-layer buffer von Dalapati, G.K., Guhathakurata, S., Das, A., Mahata, C., Chakraborty, S., Bhunia, S., Seng, H.L., Chattopadhyay, S., Bera, L.K., Tripathy, S.

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Direct measurement of proton-beam-written polymer optical waveguide sidewall morphorlogy using an atomic force microscope von Sum, T. C., Bettiol, A. A., Seng, H. L., Kan, J. A. van, Watt, F.

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