Quantification of micro-area analysis in SIMS von Seki, Setsuko, Tamura, Hifumi

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A Lithium Liquid Metal Ion Source with a Sealed-Cone-Type Reservoir von Seki, Setsuko, Tamura, Hifumi, Akiba, Tsuneo, Sumiya, Hiroyuki

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SHOES-HEEL PORTION OPENING/CLOSING MECHANISM von SEKI SETSUKO

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Solid Phase Epitaxy on Si Surfaces Studied by Scanning Tunneling Microscopy. Surface Analysis without Interference of Background Peaks by a Combined SIMS-ESDMS Technique von SEKI, Setsuko, SUMIYA, Hiroyuki, TAMURA, Hifumi

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Acid Spray for Enhancement of MH+ Ion Intensity in Secondary Ion Mass Spectrometry von Seki, Setsuko, Kambara, Hideki

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Improvements of the Accuracy of Depth Profiling in Secondary Ion Mass Spectrometry(SIMS) by using a Mini-Projection Technique von SUMIYA, Hiroyuki, MUTO, Katsumi, TAMURA, Hifumi, SEKI, Setsuko

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A Red Phosphor of High Lumen Equivalent,  Y 2 W 3 O 12 : Eu3 von Kano, Tsuyoshi, Kinameri, Kanji, Seki, Setsuko

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Analysis of Surface Contamination by a New Combined Technique of SIMS and ESDMS von SEKI, Setsuko, SUMIYA, Hiroyuki, TAMURA, Hifumi, HIROSE, Hiroshi

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Addition of acid in SIMS von Seki, Setsuko

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The Eu site symmetry in AEu(MoO 4) 2 ( A = Cs or Rb) generating saturated red luminescence von Yamamoto, Hajime, Seki, Setsuko, Ishiba, Tsutomu

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Surface Analysis without Interference of Background Peaks by a Combined SIMS-ESDMS Technique von SEKI, Setsuko, SUMIYA, Hiroyuki, TAMURA, Hifumi

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Improvemeuts of the Accuracy of Depth Profiling in Secondary Ion Mass Spectrometry (SIMS) by using a Mini-Projection Technique von SUMIYA, Hiroyuki, MUTO, Katsumi, TAMURA, Hifumi, SEKI, Setsuko

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CHARGED PARTICLE DEFLECTING SYSTEM von HOTTA MASANAO, SEKI SETSUKO

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MULTIFUNCTION SAMPLE SURFACE ANALYZING DEVICE von TAMURA HIFUMI, SEKI SETSUKO

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A Technique for Elimination of Memory Effect by Coating the Adjacent Mechanical Surfaces with Non-Interference Materials von SUMIYA, Hiroyuki, IKEBE, Yoshinori, TAMURA, Hifumi, SEKI, Setsuko

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Preparation and luminescence properties of Y 2(WO 4) 3:Eu 3 von Kano, Tsuyoshi, Seki, Setsuko, Chiou, Shing Zhung

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Preparation and luminescence properties of Y2(WO4)3:Eu3 von Kano, Tsuyoshi, Seki, Setsuko, Chiou, Shing Zhung

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ION SOURCE FOR SECONDARY ION MASS SPECTROGRAPH von TAMURA HIFUMI, SEKI SETSUKO

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Application to Bio-Organic Compounds von KAMBARA, Hideki, SEKI, Setsuko

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ION SOURCE FOR SECONDARY ION MASS SPECTROMETER von SEKI SETSUKO, KANBARA HIDEKI

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