Charge-Exchange Spectra of Hydrogenic and He-like Iron von Wargelin, B. J, Beiersdorfer, P, Neill, P. A, Olson, R. E, Scofield, J. H

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Energy-dependent excitation cross section measurements of the diagnostic lines of Fe XVII von Brown, G V, Beiersdorfer, P, Chen, H, Scofield, J H, Boyce, K R, Kelley, R L, Kilbourne, C A, Porter, F S, Gu, M F, Kahn, S M, Szymkowiak, A E

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Observation of a multiply ionized plasma with index of refraction greater than one von FILEVICH, J, ROCCA, J. J, SHLYAPTSEV, V. N, MARCONI, M. C, MOON, S. J, NILSEN, J, SCOFIELD, J. H, DUNN, J, SMITH, R. F, KEENAN, R, HUNTER, J. R

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X-ray-line diagnostic of magnetic field strength for high-temperature plasmas von Beiersdorfer, P, Scofield, J H, Osterheld, A L

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Sputtered molybdenum bilayer back contact for copper indium diselenide-based polycrystalline thin-film solar cells von Scofield, John H., Duda, A., Albin, D., Ballard, B.L., Predecki, P.K.

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Observation of interference between dielectronic recombination and radiative recombination in highly charged uranium ions von Knapp, DA, Beiersdorfer, P, Chen, MH, Scofield, JH, Schneider, D

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Reproducible technique for fabrication of thin films of high transition temperature superconductors von MANKIEWICH, P. M, SCOFIELD, J. H, SKOCPOL, W. J, HOWARD, R. E, DAYEM, A. H, GOOD, E

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State-selective quantum interference observed in the recombination of highly charged Hg 75+...78+ mercury ions in an electron beam ion trap von González Martínez, A J, López-Urrutia, J R Crespo, Braun, J, Brenner, G, Bruhns, H, Lapierre, A, Mironov, V, Soria Orts, R, Tawara, H, Trinczek, M, Ullrich, J, Scofield, J H

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ac method for measuring low‐frequency resistance fluctuation spectra von Scofield, John H.

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Reconciliation of different gate-voltage dependencies of 1/f noise in n-MOS and p-MOS transistors von Scofield, J.H., Borland, N., Fleetwood, D.M.

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Simulating a Maxwellian plasma using an electron beam ion trap von Savin, D. W., Beiersdorfer, P., Kahn, S. M., Beck, B. R., Brown, G. V., Gu, M. F., Liedahl, D. A., Scofield, J. H.

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Electron Impact Excitation Cross Section Measurement for n = 3 to n = 2 Line Emission in Fe17+ to Fe23 von Chen, H, Gu, M. F, Beiersdorfer, P, Boyce, K. R, Brown, G. V, Kahn, S. M, Kelley, R. L, Kilbourne, C. A, Porter, F. S, Scofield, J. H

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Demonstration of a soft X-ray amplifier von MATTHEWS, D. L, HAGELSTEIN, P. L, CAMPBELL, E. M, HATCHER, C. W, HAWRYLUK, A. M, KAUFFMAN, R. L, PLEASANCE, L. D, RAMBACH, G, SCOFIELD, J. H, STONE, G, WEAVER, T. A, ROSEN, M. D, ECKART, M. J, CEGLIO, N. M, HAZI, A. U, MEDECKI, H, MCGOWAN, B. J, TREBES, J. E, WHITTEN, B. L

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X-ray attenuation cross sections for energies 100 eV to 100 keV and elements Z = 1 to Z = 92 von Saloman, E.B., Hubbell, J.H., Scofield, J.H.

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Demonstration of X-ray amplifiers near the carbon K edge von MACGOWAN, B. J, MAXON, S, DA SILVA, L. B, FIELDS, D. J, KEANE, C. J, MATTHEWS, D. L, OSTERHELD, A. L, SCOFIELD, J. H, SHIMKAVEG, G, STONE, G. F

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1/f noise and radiation effects in MOS devices von Fleetwood, D.M., Meisenheimer, T.L., Scofield, J.H.

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Energies of nickel-like 4d to 4p laser lines von Scofield, J H, MacGowan, B J

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Physical basis for nondestructive tests of MOS radiation hardness von Scofield, J.H., Fleetwood, D.M.

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Excitation Cross Section Measurement for n = 3 to n = 2 Line Emission in Fe(20+) to Fe(23+) von Chen, H, Beiersdorfer, P, Scofield, J H, Brown, G V, Boyce, K R, Kelley, R L, Kilbourne, C A, Porter, F S, Gu, M F, Kahn, S M

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Demonstration of soft x-ray amplification in nickel-like ions von MacGowan, BJ, Maxon, S, Hagelstein, PL, Keane, CJ, London, RA, Matthews, DL, Rosen, MD, Scofield, JH, Whelan, DA

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