Sharp and rectified imaging of plane test objects in diffractive grazing incidence interferometers von Schwider, J

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Interferometric grazing incidence test of rough steep convex spherical and aspherical surfaces: first simulations and experimental proof of principle von Rothau, S, Lindlein, N, Schwider, J

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Multiple beam Fizeau interferometer with filtered frequency comb illumination von Schwider, J.

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Fizeau-type multi-pass Shack-Hartmann-Test von Schwider, J

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Coarse-Frequency-Comb Multiple-Beam Interferometry: Phase Assessment Using Common Phase Shifting Procedures von Schwider, J

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Absolute testing of the reference surface of a Fizeau interferometer through even/odd decompositions von Schreiner, R, Schwider, J, Lindlein, N, Mantel, K

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Multi-pass Shack-Hartmann planeness test: monitoring thermal stress von Schwider, J, Leuchs, G

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Phase retrieval from carrier frequency interferograms: reduction of the impact of space-variant disturbances von Schwider, J., Nercissian, V., Mantel, K.

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Dispersive interferometric profilometer von Schwider, J, Zhou, L

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50 years of optics research [Invited] von Schwider, Johannes

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White-light Fizeau interferometer von Schwider, J

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Lateral shearing interferometer based on two Ronchi phase gratings in series von Schreiber, H, Schwider, J

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Dynamic range expansion of a Shack-Hartmann sensor by use of a modified unwrapping algorithm von Pfund, J, Lindlein, N, Schwider, J

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On the calibration of diffractive nulls for transmission tests of aspheric components von Schwider, J., Lindlein, N., Mantel, K., Harder, I.

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Interferometric homogeneity test using adaptive frequency comb illumination von Mantel, K, Schwider, J

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Detection of undersampling from measured phase-shifting data von Schwider, J

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Red-green-blue interferometer for the metrology of discontinuous structures von Pförtner, Andreas, Schwider, Johannes

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Confocal microscopy with a refractive microlens-pinhole array von Eisner, M, Lindlein, N, Schwider, J

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Absolute sphericity measurement: a comparative study of the use of interferometry and a Shack-Hartmann sensor von Pfund, J, Lindlein, N, Schwider, J, Burow, R, Blümel, T, Elssner, K E

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Dispersion error in white-light linnik interferometers and its implications for evaluation procedures von Pf Rtner, A, Schwider, J

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