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  1. 1
    System and method for in-situ X-ray diffraction-based real-time monitoring of microstructure properties of printing objects

    System and method for in-situ X-ray diffraction-based real-time monitoring of microstructure properties of printing objects von Schultheis, Lester W, Huang, Huapeng, Zavalij, Peter

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  2. 2
    SYSTEM AND METHOD FOR IN-SITU X-RAY DIFFRACTION-BASED REAL-TIME MONITORING OF MICROSTRUCTURE PROPERTIES OF PRINTING OBJECTS

    SYSTEM AND METHOD FOR IN-SITU X-RAY DIFFRACTION-BASED REAL-TIME MONITORING OF MICROSTRUCTURE PROPERTIES OF PRINTING OBJECTS von SCHULTHEIS, LESTER W, ZAVALIJ, PETER, HUANG, HUAPENG

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