Remote surface optical phonon scattering in ferroelectric Ba0.6Sr0.4TiO3 gated graphene von Chen, Hanying, Li, Tianlin, Hao, Yifei, Rajapitamahuni, Anil, Xiao, Zhiyong, Schoeche, Stefan, Schubert, Mathias, Hong, Xia

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Optical Chirality Determined from Mueller Matrices von Arwin, Hans, Schoeche, Stefan, Hilfiker, James, Hartveit, Mattias, Järrendahl, Kenneth, Juárez-Rivera, Olga Rubi, Mendoza-Galván, Arturo, Magnusson, Roger

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Tunable Hyperbolic Metamaterials Based on Self-Assembled Carbon Nanotubes von Roberts, John Andris, Yu, Shang-Jie, Ho, Po-Hsun, Schoeche, Stefan, Falk, Abram L, Fan, Jonathan A

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Remote surface optical phonon scattering in ferroelectric Ba 0.6 Sr 0.4 TiO 3 gated graphene von Chen, Hanying, Li, Tianlin, Hao, Yifei, Rajapitamahuni, Anil, Xiao, Zhiyong, Schoeche, Stefan, Schubert, Mathias, Hong, Xia

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Effective structural chirality of beetle cuticle determined from transmission Mueller matrices using the Tellegen constitutive relations von Arwin, Hans, Magnusson, Roger, Järrendahl, Kenneth, Schoeche, Stefan

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In-cycle evolution of thickness and roughness parameters during oxygen plasma enhanced ZnO atomic layer deposition using in situ spectroscopic ellipsometry von Traouli, Yousra, Kilic, Ufuk, G. Kilic, Sema, Hilfiker, Matthew, Schmidt, Daniel, Schoeche, Stefan, Schubert, Eva, Schubert, Mathias

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Nanocolumnar Metamaterial Platforms: Scaling Rules for Structural Parameters Revealed from Optical Anisotropy (Advanced Optical Materials 30/2024) von Kilic, Ufuk, Traouli, Yousra, Hilfiker, Matthew, Bryant, Khalil, Schoeche, Stefan, Feder, Rene, Argyropoulos, Christos, Schubert, Eva, Schubert, Mathias

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Nanocolumnar Metamaterial Platforms: Scaling Rules for Structural Parameters Revealed from Optical Anisotropy von Kilic, Ufuk, Traouli, Yousra, Hilfiker, Matthew, Bryant, Khalil, Schoeche, Stefan, Feder, Rene, Argyropoulos, Christos, Schubert, Eva, Schubert, Mathias

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Mid-IR and UV-Vis-NIR Mueller matrix ellipsometry characterization of tunable hyperbolic metamaterials based on self-assembled carbon nanotubes von Schöche, Stefan, Ho, Po-Hsun, Roberts, John A., Yu, Shangjie J., Fan, Jonathan A., Falk, Abram L.

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Spectroscopic ellipsometry characterization of coatings on biaxially anisotropic polymeric substrates von Hilfiker, James N., Pietz, Brandon, Dodge, Bill, Sun, Jianing, Hong, Nina, Schoeche, Stefan

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Phononic and photonic properties of shape-engineered silicon nanoscale pillar arrays von Huang, Chun Yu Tammy, Kargar, Fariborz, Debnath, Topojit, Debnath, Bishwajit, Valentin, Michael D, Synowicki, Ron, Schoeche, Stefan, Lake, Roger K, Balandin, Alexander A

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Band gap and strain engineering of pseudomorphic Ge1−x−ySixSny alloys on Ge and GaAs for photonic applications von Fernando, Nalin S., Carrasco, Rigo A., Hickey, Ryan, Hart, John, Hazbun, Ramsey, Schoeche, Stefan, Hilfiker, James N., Kolodzey, James, Zollner, Stefan

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Band gap and strain engineering of pseudomorphic Ge1− x − y Si x Sn y alloys on Ge and GaAs for photonic applications von Fernando, Nalin S., Carrasco, Rigo A., Hickey, Ryan, Hart, John, Hazbun, Ramsey, Schoeche, Stefan, Hilfiker, James N., Kolodzey, James, Zollner, Stefan

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Robust Extraction of Hyperbolic Metamaterial Permittivity Using Total Internal Reflection Ellipsometry von Zhang, Cheng, Hong, Nina, Ji, Chengang, Zhu, Wenqi, Chen, Xi, Agrawal, Amit, Zhang, Zhong, Tiwald, Tom E, Schoeche, Stefan, Hilfiker, James N, Guo, L. Jay, Lezec, Henri J

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Wafer-Scale Aluminum Nanoplasmonic Resonators with Optimized Metal Deposition von Liberman, Vladimir, Diest, Kenneth, Stull, Corey W, Cook, Matthew T, Lennon, Donna M, Rothschild, Mordechai, Schoeche, Stefan

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ORDERED NANOTREES FOR SENSING APPLICATIONS von Schoeche, Stefan, Schmidt, Daniel

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Nanocolumnar Material Platforms:Universal structural parameters revealed from optical anisotropy von Kilic, Ufuk, Traouli, Yousra, Hilfiker, Matthew, Bryant, Khalil, Schoeche, Stefan, Feder, Rene, Argyropoulos, Christos, Schubert, Eva, Schubert, Mathias

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Remote Surface Optical Phonon Scattering in Ferroelectric Ba\(_{0.6}\)Sr\(_{0.4}\)TiO\(_{3}\) Gated Graphene von Chen, Hanying, Li, Tianlin, Hao, Yifei, Rajapitamahuni, Anil, Xiao, Zhiyong, Schoeche, Stefan, Schubert, Mathias, Xia, Hong

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Fast and accurate Mueller matrix infrared ellipsometer von Green, Steven E, Schoeche, Stefan, Welch, James D, Liphardt, Martin M, Herzinger, Craig M

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Fast and accurate mueller matrix infrared spectroscopic ellipsometer von Green, Steven E, Schoeche, Stefan, Welch, James D, Liphardt, Martin M, Herzinger, Craig M

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