Low temperature micromechanical properties of nanocrystalline CoCrFeNiMn high entropy alloy von Rusakova, H.V., Fomenko, L.S., Smirnov, S.N., Podolskiy, A.V., Shapovalov, Y.O., Tabachnikova, E.D., Tikhonovsky, M.A., Levenets, A.V., Zehetbauer, M.J., Schafler, E.

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Effects of releasing the hydrostatic pressure on the nanostructure after severe plastic deformation of Cu von Schafler, E.

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Microstructure and mechanical properties of high purity nanostructured titanium processed by high pressure torsion at temperatures 300 and 77 K von Podolskiy, A. V., Mangler, C., Schafler, E., Tabachnikova, E. D., Zehetbauer, M. J.

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Mechanical properties of a two-phase high-entropy Fe50Mn30Co10Cr10 alloy down to ultralow temperatures von Tabachnikova, E. D., Hryhorova, T. V., Shumilin, S. E., Kolodiy, I. V., Shapovalov, Yu. O., Semerenko, Yu. O., Smirnov, S. N., Kashuba, I. V., Tikhonovsky, M. A., Zehetbauer, M. J., Schafler, E.

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Lattice defect investigation of ECAP-Cu by means of X-ray line profile analysis, calorimetry and electrical resistometry von Schafler, E., Steiner, G., Korznikova, E., Kerber, M., Zehetbauer, M.J.

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Structure and cryogenic mechanical properties of severely deformed nonequiatomic alloys of Fe–Mn–Co–Cr system von Tabachnikova, E. D., Hryhorova, T. V., Smirnov, S. N., Kolodiy, I. V., Shapovalov, Yu. O., Levenets, A. V., Shumilin, S. E., Kashuba, I. V., Tikhonovsky, M. A., Spieckermann, F., Zehetbauer, M. J., Schafler, E., Huang, Y., Langdon, T. G.

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Thermally activated deformation of nanocrystalline and coarse grained CoCrFeNiMn high entropy alloy in the temperature range 4.2–350 K von Podolskiy, A. V., Schafler, E., Tabachnikova, E. D., Tikhonovsky, M. A., Zehetbauer, M. J.

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High cycle fatigue deformation mechanisms of a single phase CrMnFeCoNi high entropy alloy von Ghomsheh, M. Zare, Khatibi, G., Weiss, B., Lederer, M., Schwarz, S., Steiger-Thirsfeld, A., Tikhonovsky, M.A., Tabachnikova, E.D., Schafler, E.

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Texture evolution of Mg during high-pressure torsion von Bonarski, B. J., Schafler, E., Mingler, B., Skrotzki, W., Mikulowski, B., Zehetbauer, M. J.

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The Role of Hydrostatic Pressure in Severe Plastic Deformation von Zehetbauer, M.J., Stüwe, H.P., Vorhauer, A., Schafler, E., Kohout, J.

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Nanostructuring of p- and n-type skutterudites reaching figures of merit of approximately 1.3 and 1.6, respectively von Rogl, G., Grytsiv, A., Rogl, P., Bauer, E., Hochenhofer, M., Anbalagan, R., Mallik, R.C., Schafler, E.

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Effect of thermal treatment on microstructure in high pressure torsion (HPT) deformed nickel von Schafler, E., Pippan, R.

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Microstructural investigation of the annealing behaviour of high-pressure torsion (HPT) deformed copper von Schafler, E., Kerber, M.B.

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High-ZT half-Heusler thermoelectrics, Ti0.5Zr0.5NiSn and Ti0.5Zr0.5NiSn0.98Sb0.02: Physical properties at low temperatures von Rogl, G., Yubuta, K., Romaka, V.V., Michor, H., Schafler, E., Grytsiv, A., Bauer, E., Rogl, P.

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Measurement of screw and edge dislocation density by means of X-ray Bragg profile analysis von Schafler, E, Zehetbauer, M, Ungàr, T

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Direct SPD-processing to achieve high-ZT skutterudites von Rogl, G., Grytsiv, A., Anbalagan, R., Bursik, J., Kerber, M., Schafler, E., Zehetbauer, M., Bauer, E., Rogl, P.

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A second-order phase-transformation of the dislocation structure during plastic deformation determined by in situ synchrotron X-ray diffraction von Schafler, E., Simon, K., Bernstorff, S., Hanák, P., Tichy, G., Ungár, T., Zehetbauer, M.J.

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Correlation between the microstructure studied by X-ray line profile analysis and the strength of high-pressure-torsion processed Nb and Ta von Jóni, B., Schafler, E., Zehetbauer, M., Tichy, G., Ungár, T.

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Long term hydrogen storage properties of ZK60 Mg-alloy as processed by different methods of SPD von Cengeri, P., Kimoto, Y., Janoska, M., Abbasi, Z., Morisada, Y., Fujii, H., Enzinger, N., Sommitsch, Ch, Boczkal, G., Krexner, G., Zehetbauer, M. J., Schafler, E.

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Enhancing tensile properties of Cu and Cu-Al alloys cryogenically processed by high pressure torsion von Wei, Kun Xia, Horky, J., Wei, Wei, Zehetbauer, M.J., Setman, D., Schafler, E., Hu, Jing

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