An in-plane anisotropic organic semiconductor based upon poly(3-hexyl thiophene) von Amundson, Karl R, Sapjeta, B.Joyce, Lovinger, Andrew J, Bao, Zhenan

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Infrared spectroscopic analysis of the Si/SiO2 interface structure of thermally oxidized silicon von Queeney, K. T., Weldon, M. K., Chang, J. P., Chabal, Y. J., Gurevich, A. B., Sapjeta, J., Opila, R. L.

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Morphological and Transistor Studies of Organic Molecular Semiconductors with Anisotropic Electrical Characteristics von Chen, X. Linda, Lovinger, Andrew J, Bao, Zhenan, Sapjeta, Joyce

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Properties of high κ gate dielectrics Gd2O3 and Y2O3 for Si von Kwo, J., Hong, M., Kortan, A. R., Queeney, K. L., Chabal, Y. J., Opila, R. L., Muller, D. A., Chu, S. N. G., Sapjeta, B. J., Lay, T. S., Mannaerts, J. P., Boone, T., Krautter, H. W., Krajewski, J. J., Sergnt, A. M., Rosamilia, J. M.

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Microstructure of thin tantalum films sputtered onto inclined substrates: Experiments and atomistic simulations von Dalla Torre, J., Gilmer, G. H., Windt, D. L., Kalyanaraman, R., Baumann, F. H., O’Sullivan, P. L., Sapjeta, J., Dı́az de la Rubia, T., Djafari Rouhani, M.

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Profiling nitrogen in ultrathin silicon oxynitrides with angle-resolved x-ray photoelectron spectroscopy von Chang, J. P., Green, M. L., Donnelly, V. M., Opila, R. L., Eng, J., Sapjeta, J., Silverman, P. J., Weir, B., Lu, H. C., Gustafsson, T., Garfunkel, E.

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Interface reactions of high-κ Y2O3 gate oxides with Si von Busch, B. W., Kwo, J., Hong, M., Mannaerts, J. P., Sapjeta, B. J., Schulte, W. H., Garfunkel, E., Gustafsson, T.

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Polarized Electroluminescence from Aligned Chromophores by the Friction Transfer Method von Chen, X. L., Bao, Z., Sapjeta, B. J., Lovinger, A. J., Crone, B.

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The interface formation of copper and low dielectric constant fluoro-polymer: Plasma surface modification and its effect on copper diffusion von Du, M., Opila, R. L., Donnelly, V. M., Sapjeta, J., Boone, T.

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The precipitation of Fe at the Si–SiO2 interface von Wong-Leung, J., Eaglesham, D. J., Sapjeta, J., Jacobson, D. C., Poate, J. M., Williams, J. S.

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Thermal evolution of impurities in wet chemical silicon oxides von Gurevich, A. B., Weldon, M. K., Chabal, Y. J., Opila, R. L., Sapjeta, J.

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The Evolution of Chemical Oxides Into Ultrathin Oxides: A Spectroscopic Characterization von Rosamilia, J.M., Sapjeta, B.J., Chabal, Y.J., Opila, R.L., Masaitis, R., Eng, J., Green, Martin L., Boone, T., Sorsch, Thomas

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Pitting of the silicon layer of poly buffered LOCOS stack von OBENG, Y. S, BRADY, D. C, VITKAVAGE, S. C, TAYLOR, J. A, HANSON, K. J, SAPJETA, B. J

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Effect of cobalt on fibrous nickel hydroxide electrodes von LAW, H. H, SAPJETA, J

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Protective Treatments for Nickel‐Based Contact Materials von Law, H. H., Sapjeta, J., Chidsey, C. E. D., Putvinski, T. M.

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A novel substrate for nickel-cadmium batteries von LAW, H. H, SAPJETA, J

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Electrochemical aspects of corrosion resistance and etching of metallizations for microelectronics von Comizzoli, R.B., Frankenthal, R.P., Hanson, K.J., Konstadinidis, K., Opila, R.L., Sapjeta, J., Sinclair, J.D., Takahashi, K.M., Frank, A.L., Ibidunni, A.O.

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Polycations. 3. Coion interactions with quaternized polyamines by diffusion and potentiometric measurements von Ander, Paul, Casiero, M, Geer, T, Leung-Louie, L, Sapjeta, J, Savner, S

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Regeneration of ion-exchange resins used for gold recovery von Sapjeta, Joyce, Law, Henry H, Caseboldt, Jack R

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Mechanistic studies of hydrophilic wafer bonding and Si exfoliation for SOI fabrication von Weldon, M.K., Marsico, V., Chabal, Y.J., Christman, S.B., Chaban, E.E., Jacobson, D.C., Sapjeta, J.B., Pinczuk, A., Dennis, B.S., Mills, A.P., Goodwin, C.A., Hsieh, C.-M.

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