Ellipsometric Method for Measuring the CdTe Buffer-Layer Temperature in the Molecular-Beam Epitaxy of CdHgTe von Shvets, V. A., Azarov, I. A., Marin, D. V., Yakushev, M. V., Rykhlitsky, S. V.

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POSSIBILITIES OF THE METHOD OF DIELECTROPHORESIS OF ERYTHROCYTES IN DISTINCTION OF PATIENTS WITH FATTY LIVER DISEASE OF ALCOHOLIC AND NON-ALCOHOLIC GENESIS von M. V. Kruchinina, M. V. Parulikova, S. A. Kurilovich, A. A. Gromov, V. M. Generalov, V. N. Kruchinin, S. V. Rykhlitsky, A. A. Shestov

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Time-resolved microellipsometry for rapid thermal processes monitoring von Spesivtsev, E.V., Rykhlitsky, S.V., Shvets, V.A., Chikichev, S.I., Mardezhov, A.S., Nazarov, N.I., Volodin, V.A.

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RAMAN-SPECTROSCOPY OF HEMOGLOBINE IN DIAGNOSTICS OF RESISTANT ARTERIAL HYPERTENSION von M. V. Kruchinina, Ya. Sh. Schwartz, A. A. Gromov, V. N. Kruchinin, V. A. Volodin, S. V. Rykhlitsky

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Structural characterization of iron silicide nanoclusters in Si/FeSi heterosystems using magneto-optic ellipsometry von Kosyrev, N. N., Zabluda, V. N., Varnakov, S. N., Shvets, V. A., Rykhlitsky, S. V., Spesivtsev, E. V., Prokop’ev, V. Yu

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Formation of pseudoisocyanine J-aggregates during thin-film formation von Shelkovnikov, V. V., Ivanova, Z. M., Plekhanov, A. I., Spesivtsev, E. V., Rykhlitsky, S. V.

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Time-resolved microellipsometry for rapid thermal processes monitoring von SPESIVTSEV, E. V, RYKHLITSKY, S. V, SHVETS, V. A, CHIKICHEV, S. I, MARDEZHOV, A. S, NAZAROV, N. I, VOLODIN, V. A

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Optical Properties of Ferroelectric Films HfxZryO2 and La:HfxZryO2 according to Ellipsometry Data von Kruchinin, V. N., Spesivtsev, E. V., Rykhlitsky, C. V., Gritsenko, V. A., Mehmood, F., Mikolajick, T., Schroeder, U.

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PP.41.05: CHANGES IN ERYTHROCYTE PARAMETERS CONTRIBUTE TO THE DEVELOPMENT OF RESISTANT HYPERTENSION von Kruchinina, M., Gromov, A., Generalov, V., Kruchinin, V., Rykhlitsky, S., Volodin, V.

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