Low-aberration ExB deflector optics for scanning electron microscopy von Enyama, Momoyo, Nishi, Ryuji, Ito, Hiroyuki, Yamasaki, Jun

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Double-twist cylinders in liquid crystalline cholesteric blue phases observed by transmission electron microscopy von Tanaka, Shu, Yoshida, Hiroyuki, Kawata, Yuto, Kuwahara, Ryusuke, Nishi, Ryuji, Ozaki, Masanori

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preventive factors for aspirin-induced peptic ulcer: aspirin ulcer and corpus atrophy von Shiotani, Akiko, Sakakibara, Takashi, Yamanaka, Yoshiyuki, Nishi, Ryuji, Imamura, Hiroshi, Fujita, Minoru, Tarumi, Ken-ichi, Kamada, Tomoari, Hata, Jiro, Haruma, Ken

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Network Tele-Microscopy in Metallic Glasses von NAGASE, Takeshi, Nishi, Ryuji, ICHIKAWA, Satoshi

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Spherical aberration correction with an in-lens N-fold symmetric line currents model von Hoque, Shahedul, Ito, Hiroyuki, Nishi, Ryuji

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Structural modifications of dentinal microcracks with human aging von Kubo, Mizuho, Miura, Jiro, Sakata, Takao, Nishi, Ryuji, Takeshige, Fumio

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Aspirin-induced peptic ulcer and genetic polymorphisms von Shiotani, Akiko, Sakakibara, Takashi, Nomura, Maki, Yamanaka, Yoshiyuki, Nishi, Ryuji, Imamura, Hiroshi, Tarumi, Ken-ichi, Kamada, Tomoari, Hata, Jiro, Haruma, Ken

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Network Tele-Microscopyによる金属ガラスの微細組織観察 von 永瀬, 丈嗣, 西, 竜治, 市川, 聡

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Automatic system for electron tomography data collection in the ultra-high voltage electron microscope von Cao, Meng, Nishi, Ryuji, Wang, Fang

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Multiple scattering effects of MeV electrons in very thick amorphous specimens von Wang, Fang, Zhang, Hai-Bo, Cao, Meng, Nishi, Ryuji, Takaoka, Akio

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Fast auto-acquisition tomography tilt series by using HD video camera in ultra-high voltage electron microscope von Nishi, Ryuji, Cao, Meng, Kanaji, Atsuko, Nishida, Tomoki, Yoshida, Kiyokazu, Isakozawa, Shigeto

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Axial geometrical aberration correction up to 5th order with N-SYLC von Hoque, Shahedul, Ito, Hiroyuki, Takaoka, Akio, Nishi, Ryuji

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A Novel Method for Higher Order Aberration Correction in Electron Microscopes von Hoque, Shahedul, Ito, Hiroyuki, Takaoka, Akio, Nishi, Ryuji

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Lorentzian-like image blur of gold nanoparticles on thick amorphous silicon films in ultra-high-voltage transmission electron microscopy von Oshima, Yoshifumi, Nishi, Ryuji, Asayama, Kyoichiro, Arakawa, Kazuto, Yoshida, Kiyokazu, Sakata, Takao, Taguchi, Eiji, Yasuda, Hidehiro

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Determination of the linear attenuation range of electron transmission through film specimens von Wang, Fang, Zhang, Hai-Bo, Cao, Meng, Nishi, Ryuji, Takaoka, Akio

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Non-contact atomic force microscopy study of atomic manipulation on an insulator surface by nanoindentation von Nishi, Ryuji, Miyagawa, Daisuke, Seino, Yoshihide, Yi, Insook, Morita, Seizo

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Image quality of microns-thick specimens in the ultra-high voltage electron microscope von Wang, Fang, Zhang, Hai-Bo, Cao, Meng, Nishi, Ryuji, Takaoka, Akio

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Spherical aberration correction with threefold symmetric line currents von Hoque, Shahedul, Ito, Hiroyuki, Nishi, Ryuji, Takaoka, Akio, Munro, Eric

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Non-contact AFM observation of the ( 3 × 3 ) to (3 × 3) phase transition on Sn/Ge(1 1 1) and Sn/Si(1 1 1) surfaces von Yi, Insook, Nishi, Ryuji, Sugimoto, Yoshiaki, Morita, Seizo

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Lateral Manipulation of Single Defect on Insulating Surface Using Noncontact Atomic Force Microscope von Yi, Insook, Nishi, Ryuji, Abe, Masayuki, Sugimoto, Yoshiaki, Morita, Seizo

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