In situ Ellipsometric Control of Growth Processes of ZnTe and CdTe Buffer Layers in Technology of Molecular Beam Epitaxy of Mercury Cadmium Telluride von Shvets, V. A., Marin, D. V., Yakushev, M. V., Rykhlitskii, S. V.

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Electric and Viscoelastic Parameters of Erythrocytes in Models for Diagnostics of Adenomatous Polyps and Stages of Colorectal Cancer in Optical Detection of Cells in an Inhomogeneo... von Kruchinina, M. V., Gromov, A. A., Shcherbakova, L. V., Kruchinina, E. V., Generalov, V. M., Generalov, K. V., Kruchinin, V. N., Rykhlitskii, S. V., Yakovina, I. N., Yakovlev, M. V., Minin, O. V., Minin, I. V.

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Atomic Structure and Optical Properties of Plasma Enhanced Chemical Vapor Deposited SiCOH Low-k Dielectric Film von Kruchinin, V. N., Volodin, V. A., Rykhlitskii, S. V., Gritsenko, V. A., Posvirin, I. P., Shi, Xiaoping, Baklanov, M. R.

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Investigation of the Temperature Dependence of the Spectra of Optical Constants of Hg1 – xCdхTe Films Grown Using Molecular Beam Epitaxy von Shvets, V. A., Marin, D. V., Yakushev, M. V., Rykhlitskii, S. V.

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Parametric Model of the Optical Constant Spectra of Hg1 – xCdxTe and Determination of the Compound Composition von Shvets, V. A., Marin, D. V., Remesnik, V. G., Azarov, I. A., Yakushev, M. V., Rykhlitskii, S. V.

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Ellipsometric In Situ Methods of Temperature Control in the Technology of Growing MBE MCT Layers von Shvets, V. A., Marin, D. V., Azarov, I. A., Yakushev, M. V., Rykhlitskii, S. V.

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Optical Properties of (ZrO2)1 – x(Y2O3)х (х = 0–0.037) Crystals Grown by Directional Crystallization of the Melt von Perevalov, T. V., Kruchinin, V. N., Rykhlitskii, S. V., Gritsenko, V. A., Eliseev, A. P., Lomonova, E. E.

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The Use of Spectral Ellipsometry and Raman Spectroscopy in Screening Diagnostics of Colorectal Cancer von Kruchinin, V. N., Kruchinina, M. V., Prudnikova, Ya. I., Spesivtsev, E. V., Rykhlitskii, S. V., Volodin, V. A., Shekhovtsov, S. V., Pel’tek, S. E.

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Optical Properties of Thin Films of Zinc Phthalocyanines Determined by Spectroscopic Ellipsometry von Kruchinin, V. N., Klyamer, D. D., Spesivtsev, E. V., Rykhlitskii, S. V., Basova, T. V.

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P41 von Kruchinina, M, Starikov, A, Kurilovich, S, Kruchinin, V, Volodin, V, Rykhlitskii, S, Gromov, A, Peltec, S, Shehovtsov, S, Generalov, V

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Methodological and instrumental problems in high-precision in situ ellipsometry diagnostics of the mercury cadmium telluride layer composition in molecular beam epitaxy von Shvets, V. A., Azarov, I. A., Spesivtsev, E. V., Rykhlitskii, S. V., Yakushev, M. V., Marin, D. V., Mikhailov, N. N., Kuzmin, V. D., Remesnik, V. G., Dvoretsky, S. A.

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Ellipsometry as a high-precision technique for subnanometer-resolved monitoring of thin-film structures von Shvets, V. A., Spesivtsev, E. V., Rykhlitskii, S. V., Mikhailov, N. N.

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In situ spectroscopic ellipsometry for temperature control in molecular beam epitaxy of HgCdTe von Shvets, V.A., Marin, D.V., Azarov, I.A., Yakushev, M.V., Rykhlitskii, S.V.

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Ellipsometric thermometry in molecular beam epitaxy of mercury cadmium telluride von Marin, D.V., Shvets, V.A., Azarov, I.A., Yakushev, M.V., Rykhlitskii, S.V.

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Optical Properties of Nonstoichiometric Silicon Oxide SiOx (x < 2) von Kruchinin, V. N., Perevalov, T. V., Kamaev, G. N., Rykhlitskii, S. V., Gritsenko, V. A.

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Measuring the normalized jones matrix of anisotropic samples by means of static ellipsometry von Shvets, V. A., Spesivtsev, E. V., Rykhlitskiĭ, S. V.

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Optical Properties of Nonstoichiometric Silicon Oxide SiO x (x < 2) von Kruchinin, V N, Perevalov, T V, Kamaev, G N, Rykhlitskii, S V, Gritsenko, V A

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Ellipsometric Method of Substrate Temperature Measurement in Low-Temperature Processes of Epitaxy of InSb Layers von Shvets, V. A., Azarov, I. A., Rykhlitskii, S. V., Toropov, A. I.

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Development of methods and instruments for optical ellipsometry at the Institute of Semiconductor Physics of the Siberian Branch of the Russian Academy of Sciences von Spesivtsev, E. V., Rykhlitskii, S. V., Shvets, V. A.

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Analysis of a static scheme of ellipsometric measurements von Shvets, V. A., Spesivtsev, E. V., Rykhlitskii, S. V.

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