Local structure in Ge–Si solid-state solutions by combined Ge and Si EXAFS von Babanov, Yu.A, Deev, A.N, Ruts, Yu.V

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Determination of parameters of the local atomic surrounding in surface layers of Fe, Ni and Cu by the secondary electron fine structure method von Guy, D.E., Surnin, D.V., Deev, A.N., Ruts, Yu.V., Grebennikov, V.I.

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Application of the electron energy loss fine structure technique to the investigation of the AlAg binary system von Shamin, V.A., Kadikova, A.H., Deev, A.N., Ruts, Yu.V.

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The local atomic structure of Cu(111): An extended energy loss fine structure investigation von Surnin, D.V., Deev, A.N., Guy, D.E., Ruts, Yu.V.

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Application of the electron energy loss fine structure technique to the investigation of the Al Ag binary system von Shamin, V.A., Kadikova, A.H., Deev, A.N., Ruts, Yu.V.

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Test solution of the inverse problem for the determination of pair correlation function in the secondary electron extended fine structure technique von Guy, D.E., Deev, A.N., Surnin, D.V., Ruts, Yu.V., Grebennikov, V.I., Sokolov, O.B.

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The role of autoionization in the formation of electron spectra above Auger transitions von Guy, D.E., Ruts, Yu.V., Surnin, D.V., Grebennikov, V.I., Sokolov, O.B.

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Some results of regular algorithm applying in the EELFS method von Kadikova, A.H., Ruts, Yu.V., Ershov, N.V., Ageev, A.L.

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