Inverter models of CMOS gates for supply current and delay evaluation von Nabavi-Lishi, A., Rumin, N.C.

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Delay and current estimation in a CMOS inverter with an RC load von Hafed, M., Oulmane, M., Rumin, N.C.

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Delay prediction from resistance-capacitance models of general MOS circuits von Martin, D., Rumin, N.C.

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A fault-tolerant array processor designed for testability and self-reconfiguration von Jain, A., Mandava, B., Rajski, J., Rumin, N.C.

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A recursive technique for computing delays in series-parallel MOS transistor circuits von Caisso, J.-P., Cerny, E., Rumin, N.C.

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Accuracy of magnitude-class calculations in switch-level modeling von Cerny, E., Hayes, J.P., Rumin, N.C.

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Transistor-level estimation of worst-case delays in MOS VLSI circuits von Dagenais, M.R., Gaiotti, S., Rumin, N.C.

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McBOOLE: A New Procedure for Exact Logic Minimization von Dagenais, M.R., Agarwal, V.K., Rumin, N.C.

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An analytical model for current, delay, and power analysis of submicron CMOS logic circuits von Hamoui, A.A., Rumin, N.C.

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Soft-error filtering: A solution to the reliability problem of future VLSI digital circuits von Savaria, Y., Rumin, N.C., Hayes, J.F., Agarwal, V.K.

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A Theory for the Design of Soft-Error-Tolerant VLSI Circuits von Savaria, Y., Hayes, J., Rumin, N., Agarwal, V.

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On the calculation of optimal clocking parameters in synchronous circuits with level-sensitive latches von Dagenais, M.R., Rumin, N.C.

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Worst-case delay estimation of transistor groups von Gaiotti, S., Dagenais, M. R., Rumin, N. C.

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CMOS inverter current and delay model incorporating interconnect effects von Hafed, M., Rumin, N.

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Delay and current estimation in CMOS gates using collapsing von Nabavi-Lishi, A., Rumin, N.C.

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Characterization of trapping kinetics from the lifetime dependence of thermally stimulated conductivity spectra von Rabie, S., Rumin, N.

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Accurate Delay Metric for On-chip Resistive Interconnect von Oulmane, M., Rumin, N.

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FibRumBa Database: A Resource for Biologists with Interests in Gastrointestinal Microbial Ecology, Plant Biomass Degradation, and Anaerobic Microbiology von Morrison, Mark, Daugherty, Sean C, Nelson, William C, Davidsen, Tanja, Nelson, Karen E

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Emitter sidewall junction capacitance in double-diffused transistors von Rumin, N., Lawrence, H.

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Recombination in low-resistivity n-type Zn-compensated silicon von Rabie, S., Rumin, N.

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