Collapse Fragility of Steel Structures Subjected to Earthquake Mainshock-Aftershock Sequences von Li, Yue, Song, Ruiqiang, Van De Lindt, John W

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Impact of earthquake ground motion characteristics on collapse risk of post-mainshock buildings considering aftershocks von Song, Ruiqiang, Li, Yue, van de Lindt, John W.

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The 2021 Bitcoin Bubbles and Crashes—Detection and Classification von Shu, Min, Song, Ruiqiang, Zhu, Wei

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Experimental characterization of the dominant multiple nodes charge collection mechanism in metal oxide-semiconductor transistors von Song, Ruiqiang, Chen, Shuming, Chi, Yaqing, Wu, Zhenyu, Liang, Bin, Chen, Jianjun, Xu, Jingyan, Hao, Peipei, Yu, Junting

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Recoil-Ion-Induced Single Event Upsets in Nanometer CMOS SRAM Under Low-Energy Proton Radiation von Wu, Zhenyu, Chen, Shuming, Yu, Junting, Chen, Jianjun, Huang, Pengcheng, Song, Ruiqiang

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The Separation Measurement of P -Hit and N -Hit Charge Sharing With an “S-Like” Inverter Chains Test Structure von Huang, Pengcheng, Chen, Shuming, Chen, Jianjun, Liang, Bin, Song, Ruiqiang

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Characterization of Single-Event Transient Pulse Broadening Effect in 65 nm Bulk Inverter Chains Using Heavy Ion Microbeam von Chi, Yaqing, Song, Ruiqiang, Shi, Shuting, Liu, Biwei, Cai, Li, Hu, Chunmei, Guo, Gang

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The Neutron-Gamma Pulse Shape Discrimination of CLLB Detector von Song, Ruiqiang, Peng, Shuo, Tong, Yufeng, Wu, Qi, Qian, Sen, Wang, Zhigang, Han, Jifeng

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Optimization of a double crystal monochromator von Jiang, Zheng, Wang, Eryan, Song, Ruiqiang, Guo, Siming, Wu, Jinjie, Hou, Dongjie, An, Zhenghua, Zhou, Pengyue

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Supply Voltage and Temperature Dependence of Single-Event Transient in 28-nm FDSOI MOSFETs von Xu, Jingyan, Guo, Yang, Song, Ruiqiang, Liang, Bin, Chi, Yaqing

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Analyzing and mitigating the internal single-event transient in radiation hardened flip-flops at circuit-level von Liang, Bin, Song, RuiQiang

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Flip-flops soft error rate evaluation approach considering internal single-event transient von Song, RuiQiang, Chen, ShuMing, He, YiBai, Du, YanKang

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Modeling the impact of process and operation variations on the soft error rate of digital circuits von Song, Ruiqiang, Chen, Shuming, Liang, Bin, Chi, Yaqing, Chen, Jianjun

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The 2020 global stock market crash: Endogenous or exogenous? von Song, Ruiqiang, Shu, Min, Zhu, Wei

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Total Ionizing Dose Effect on Low On/Off Switching Ratio Memristive Memories von Chi, Yaqing, Liu, Rongrong, Tang, Zhensen, Song, Ruiqiang

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Detection of financial bubbles using a log‐periodic power law singularity (LPPLS) model von Shu, Min, Song, Ruiqiang

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Comparison of single-event upset generated by heavy ion and pulsed laser von Liang, Bin, Song, Ruiqiang, Han, Jianwei, Chi, Yaqing, Chen, Rui, Hu, Chunmei, Chen, Jianjun, Ma, Yingqi, Shangguan, Shipeng

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The ‘COVID’ crash of the 2020 U.S. Stock market von Shu, Min, Song, Ruiqiang, Zhu, Wei

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Heavy ion-induced microdose effects on the reliability of planar and FinFET-based SRAM physical unclonable functions von Shao, Jinjin, Song, Ruiqiang, Li, Shaoqing, Guo, Yang, Chi, Yaqing, Liang, Bin, Chen, Jianjun, Wang, Yaohua

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The Effect of Gefitinib on Treatment Necessity and Prognosis of NSCLC Patients with Early EGFR Mutations von Song, Ruiqiang, Cheng, Yanbo, Zheng, Tianxi

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