X-ray photoelectron diffraction study of thin Cu films grown on clean Ru(0001) and O-precovered Ru(0001) von Ruebush, S.D., Couch, R.E., Thevuthasan, S., Fadley, C.S.

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DIFFRACTION AND HOLOGRAPHY WITH PHOTOELECTRONS AND FLUORESCENT X-RAYS von FADLEY, C.S., Chen, Y., Couch, R.E., Daimon, H., Denecke, R., Denlinger, J.D., Galloway, H., Hussain, Z., Kaduwela, A.P., Kim, Y.J., Len, P.M., Liesegang, J., Menchero, J., Morais, J., Palomares, J., Ruebush, S.D., Rotenberg, E., Salmeron, M.B., Scalettar, R., Schattke, W., Singh, R., Thevuthasan, S., Tober, E.D., Van Hove, M.A., Wang, Z., Ynzunza, R.X.

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Epitaxial growth modes and interlayer relaxation of thin Cu films grown on Ru(0001) and oxygen-precovered Ru(0001) von Ruebush, S.D., Couch, R.E., Thevuthasan, S., Wang, Z., Fadley, C.S.

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Variation of mean emitter depth with direction in core photoelectron emission from single crystals von Ruebush, S.D., Ynzunza, R.X., Thevuthasan, S., Kaduwela, A.P., Van Hove, M.A., Fadley, C.S.

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