Filament-based memristor switching model von Fadeev, A.V., Rudenko, K.V.

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Analytical comparison of atomic layer deposition of oxide films inside trench and hole nanostructures von Fadeev, A.V., Rudenko, K.V.

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SOS pseudo-FeFETs after furnace or rapid annealings and thining by thermal oxidation von Antonov, V.A., Tikhonenko, F.V., Popov, V.P., Miakonkikh, A.V., Rudenko, K.V., Sverdlov, V.A.

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Measurement of the gas temperature of neutrals in reactive plasmas by moderate-resolution OES von Miakonkikh, A.V., Rudenko, K.V.

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Structure evolution and charge hysteresis in buried Hafnia-Alumina oxides von Popov, V.P., Tikhonenko, F.V., Antonov, V.A., Tolmachev, K.A., Lomov, A.A., Miakonkikh, A.V., Rudenko, K.V.

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Parallel nanowire sensors with a high-k gate oxide for the sensitive operation in liquids von Popov, V.P., Tikhonenko, F.V., Antonov, V.A., Zarubanov, A.A., Gluhov, A.V., Tatarintsev, A.A., Miakonkikh, A.V., Rudenko, K.V.

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Ferroelectric properties of SOS and SOI pseudo-MOSFETs with HfO2 interlayers von Popov, V.P., Antonov, V.A., Ilnitsky, M.A., Tyschenko, I.E., Vdovin, V.I., Miakonkikh, A.V., Rudenko, K.V.

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Hafnia and alumina stacks as UTBOXs in silicon-on insulator von Popov, V.P., Antonov, V.A., Gutakovskiy, A.K., Tyschenko, I.E., Vdovin, V.I., Miakonkikh, A.V., Rudenko, K.V.

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Anisotropic plasma etching of Silicon in gas chopping process by alternating steps of oxidation and etching von Miakonkikh, A.V., Averkin, S.N., Rudenko, K.V.

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Analytical Model for Atomic-Layer Deposition of Thin Films on the Walls of Cylindrical Holes with a Relatively High Aspect Ratio von Fadeev, A. V., Rudenko, K. V.

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Analytical Model of Atomic Layer Deposition of Films on 3D Structures with High Aspect Ratios von Fadeev, A. V., Myakon’kikh, A. V., Rudenko, K. V.

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Blister suppression in the CO+ molecule implanted SOI substrates with ultrathin buried oxides von Popov, V.P., Tikhonenko, F.V., Antonov, V.A., Tarkov, S.M., Gutakovskii, A.K., Vdovin, V.I., Simakin, S.G., Rudenko, K.V.

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On peculiarities of native-metallic mineralization in the lavabreccia of the Lower-Vendian basalt formation of Volyn von Lukin, A.E., Derevskaya, E.I., Rudenko, K.V.

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Biosensor properties of SOI nanowire transistors with a PEALD [Al.sub.2][O.sub.3] dielectric protective layer von Popov, V.P, Ilnitskii, M.A, Zhanaev, E.D, Myakon'kich, A.V, Rudenko, K.V, Glukhov, A.V

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Consistent dynamics of the components of an elliptically polarised wave with zero mean amplitudes in a nonlinear isotropic gyrotropic medium in the adiabatic approximation von Makarov, V.A., Petnikova, V.M., Rudenko, K.V., Shuvalov, V.V.

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Differential visualisation of a spectrally selective structure of strongly scattering objects von Kuratov, A.S., Rudenko, K.V., Shuvalov, V.V.

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Experimental study and computer simulation of aspect ratio dependent effects observed in silicon reactive ion etching von Yunkin, V.A., Lukichev, V.F., Rudenko, K.V., Fischer, D., Voges, E.

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METHOD AND DEVICE FOR MONITORING PLASMA-CHEMICAL ETCHING PROCESSES USING DIFFERENTIAL OPTICAL ACTINOMETRY von SEMIN JU.F, VALIEV K.A, RUDENKO K.V, SUKHANOV JA.N, ORLIKOVSKIJ A.A

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METHOD AND DEVICE FOR MONITORING END-OF-ETCHING MOMENT IN HIGH- FREQUENCY AND MICROWAVE DISCHARGE PLASMA USED IN SEMICONDUCTOR DEVICE MANUFACTURING TECHNOLOGY von SEMIN JU.F, VALIEV K.A, RUDENKO K.V, SUKHANOV JA.N, ORLIKOVSKIJ A.A

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Bow shape design for river-sea vessels with increased seakeeping performance von Magarovsky, V.V., Kurchukov, K.V., Platonov, V.G., Sokolov, V.P., Rudenko, M.S.

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