Chemical bonding, optical constants, and electrical resistivity of sputter-deposited gallium oxide thin films von Ramana, C. V., Rubio, E. J., Barraza, C. D., Miranda Gallardo, A., McPeak, Samantha, Kotru, Sushma, Grant, J. T.

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Freezing Transition and Interaction Potential in Monolayers of Microparticles at Fluid Interfaces von Bonales, L. J, Rubio, J. E. F, Ritacco, H, Vega, C, Rubio, R. G, Ortega, F

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Experimental structural dynamic measurements of an artificial insect-sized wing biomimicking a crane fly forewing von Rubio, J. E., Chakravarty, U. K.

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Correlation between phase and optical properties of yttrium-doped hafnium oxide nanocrystalline thin films von Ortega, A., Rubio, E.J., Abhilash, K., Ramana, C.V.

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A Primary Extraosseous Ewing Sarcoma in the Cerebellopontine Angle of a Child: Review of Relevant Literature and Case Report von dos Santos Rubio, E J, Harhangi, B S, Kros, J M, Vincent, A J P E, Dirven, C M F

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Grain and grain boundary effects on the frequency and temperature dependent dielectric properties of cobalt ferrite–hafnium composites von Kolekar, Y.D., Sanchez, L., Rubio, E.J., Ramana, C.V.

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Microstructure and thermal oxidation behavior of yttria-stabilized hafnia nanostructured coatings deposited on alumina von Rubio, E.J., Martinez, G., Noor-A-Alam, M., Stafford, S.W., Shutthanandan, V., Ramana, C.V.

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Electronic Structure and Optical Quality of Nanocrystalline Y2O3 Film Surfaces and Interfaces on Silicon von Rubio, E. J, Atuchin, V. V, Kruchinin, V. N, Pokrovsky, L. D, Prosvirin, I. P, Ramana, C. V

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Tungsten Incorporation into Gallium Oxide: Crystal Structure, Surface and Interface Chemistry, Thermal Stability, and Interdiffusion von Rubio, E. J, Mates, T. E, Manandhar, S, Nandasiri, M, Shutthanandan, V, Ramana, C. V

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Implicit and explicit discrete-time realizations of the robust exact filtering differentiator von Carvajal-Rubio, J.E., Defoort, M., Sánchez-Torres, J.D., Djemai, M., Loukianov, A.G.

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Spectroscopic ellipsometry determination of the optical constants of titanium-doped WO3 films made by co-sputter deposition von Vargas, M., Rubio, E. J., Gutierrez, A., Ramana, C. V.

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Modeling arsenic deactivation through arsenic-vacancy clusters using an atomistic kinetic Monte Carlo approach von Pinacho, R., Jaraiz, M., Castrillo, P., Martin-Bragado, I., Rubio, J. E., Barbolla, J.

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Atomistic modeling of defect diffusion and interdiffusion in SiGe heterostructures von Castrillo, P., Jaraiz, M., Pinacho, R., Rubio, J.E.

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Physically based modelling of damage, amorphization, and recrystallization for predictive device-size process simulation von Rubio, J.E., Jaraiz, M., Martin-Bragado, I., Pinacho, R., Castrillo, P., Barbolla, J.

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Dose loss and segregation of boron and arsenic at the Si/SiO2 interface by atomistic kinetic Monte Carlo simulations von Rubio, J.E., Jaraiz, M., Martin-Bragado, I., Castrillo, P., Pinacho, R., Barbolla, J.

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Tungsten-incorporation induced red-shift in the bandgap of gallium oxide thin films von Rubio, E. J., Ramana, C. V.

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Structure, Morphology, and Optical Properties of Amorphous and Nanocrystalline Gallium Oxide Thin Films von Kumar, S. Sampath, Rubio, E.J, Noor-A-Alam, M, Martinez, G, Manandhar, S, Shutthanandan, V, Thevuthasan, S, Ramana, C.V

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Enhanced stability of hafnia based coatings in a hot gas environment von Noor-A-Alam, M., Gullapalli, S. K., Rubio, E. J., Choudhuri, A. R., Ramana, C. V.

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Physically based modeling of dislocation loops in ion implantation processing in silicon von Castrillo, P., Martin-Bragado, I., Pinacho, R., Jaraiz, M., Rubio, J.E., Mok, K.R.C., Miguel-Herrero, F.J., Barbolla, J.

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Comprehensive, physically based modelling of As in Si von Pinacho, R., Jaraiz, M., Castrillo, P., Rubio, J.E., Martin-Bragado, I., Barbolla, J.

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