Low temperature identification of interfacial and bulk defects in Al/SiO/sub 2//Si capacitor structures by electron beam induced current von Kirk, H.R., Radzimski, Z., Buczkowski, A., Rozgonyi, C.A.

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Dislocation interactions in strained-layer structures grown on GaAs and Si substrates von Hamaguchi, N., Humphreys, T.P., Moore, D.J., Parker, C.A., Bedair, S.M., Tarn, J.C.L., Jiang, B.-L., El-Masry, N., Radzimski, Z.J., Rozgonyi, G.A.

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