Measurement of thermal conductance of La0.7Sr0.3MnO3 thin films deposited on SrTiO3 and MgO substrates von Aryan, A., Guillet, B., Routoure, J.M., Fur, C., Langlois, P., Méchin, L.

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Low-frequency noise in low temperature unhydrogenated polysilicon thin film transistors von Mercha, A, Rhayem, J, Pichon, L, Valenza, M, Routoure, J.M, Carin, R, Bonnaud, O, Rigaud, D

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Meyer–Neldel parameter as a figure of merit for quality of thin-film-transistor active layer? von Pichon, L, Mercha, A, Routoure, J.M, Carin, R, Bonnaud, O, Mohammed-Brahim, T

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Phase separation and disorder in half metallic ferromagnetic manganite thin films: A theoretical study looking forward low noise nano-devices von Mercone, S., Méchin, L., Perroni, C.A., Routoure, J.M., Scotti di Uccio, U., Maritato, L., Cataudella, V.

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Subthreshold region conduction and 1/f noise empirical models in N-MOSFETs von Pichon, L., Routoure, J.M., Carin, R., Nze Mekwama, L.

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Temperature impact on the lorentzian noise induced by electron valance band tunneling in partiallydepleted SOI nMOSFETs von Guo, W., Cretu, B., Routoure, J.M., Carin, R., Simoen, E., Claeys, C.

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