Non-destructive probing of interfacial oxidation and nitridation states at RTP Si-oxides von Hoffmann, P, Schmeißer, D, Roters, G, Nenyei, Z

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Wet rapid thermal oxidation of silicon with a pyrogenic system von Lerch, W., Roters, G., Münzinger, P., Mader, R., Ostermeir, R.

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The E1 and E2 capture amplitudes in 12C(α,γ0)16O von Roters, G., Rolfs, C., Strieder, F., Trautvetter, H.P.

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Gamma-ray detection with a 4π NaI spectrometer for material analysis von Mehrhoff, M, Aliotta, M, Baumvol, I.J.R, Becker, H.-W, Berheide, M, Borucki, L, Domke, J, Gorris, F, Kubsky, S, Piel, N, Roters, G, Rolfs, C, Schulte, W.H

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Secondary ion mass spectrometry analysis of implanted and rapid thermal processing annealed wafers for sub-100 nanometer technology von Ehrke, U., Sears, A., Lerch, W., Paul, S., Roters, G., Downey, D. F., Arevalo, E. A.

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Increasing Efficiency by Maximizing Electrical Output von Eveleth,Edward, Gold,Scott

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The E2-contribution to the 12C(α,γ) 16O- reaction von Trautvetter, H.P., Roters, G., Rolfs, C., Schmidt, S., Descouvemont, P.

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Explosive hydrogen burning of 35Cl von Iliadis, C., Görres, J., Ross, J.G., Scheller, K.W., Wiescher, M., Azuma, R.E., Roters, G., Trautvetter, H.P., Evans, H.C.

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Lights and shadows in european RTP history (as it happened or raight have happened) von Nenyei, Z., Roters, G.

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RTP-Grown Oxynitride Layers Meet Gate Challenges von Chung, H Y A, Niess, J, Dietl, W, Roters, G

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Precise measurement of the Jπ = 1 − resonance in 14N by 13C+p elastic scattering on a thick target von Benjelloun, M., Delbar, Th, Galster, W., Leleux, P., Liénard, E., Lipnik, P., Duhamel, P., Vanhorenbeeck, J., Rolfs, C., Roters, G., Trautvetter, H.P., Rodney, W.

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Hydrogen depth profiling using18O ions von Becker, H. W., Bahr, M., Berheide, M., Borucki, L., Buschmann, M., Rolfs, C., Roters, G., Schmidt, S., Schulte, W. H., Mitchell, G. E., Schweitzer, J. S.

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Target and detection techniques for the sup 13 N( p ,. gamma. ) sup 14 O reaction using radioactive ion beams: sup 13 C( p ,. gamma. ) sup 14 N reaction as a test von Galster, W., Leleux, P., Licot, I., Lienard, E., Lipnik, P., Mertens, D., Delbar, T., Vervier, J., Decrock, P., Huyse, M., Van Duppen, P., Duhamel, P., Vanhorenbeeck, J., Roters, G., Rolfs, C., Schroeder, U., Trautvetter, H.P., Wolke, K., Lambert, J., Rodney, W.S.

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A numerical study of the influence of crystal plasticity modeling parameters on the plastic anisotropy of rolled aluminum sheet von Kasemer, M, Falkinger, G, Roters, F

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Target and detection techniques for the 13N(p, gamma )14O reaction using radioactive ion beams: 13C(p, gamma )14N reaction as a test case von Galster, W, Leleux, P, Licot, I, I, Lienard, E, Lipnik, P, Mertens, D, Delbar, T, Vervier, J, Decrock, P, Huyse, M, Van Duppen P, Duhamel, P, Vanhorenbeeck, J, Roters, G, Rolfs, C, Schroeder, U, Trautvetter, HP, Wolke, K, Lambert, J, Rodney, WS

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Target and detection techniques for the N 13 ( p ,γ ) 14 O reaction using radioactive ion beams: C 13 ( p ,γ ) 14 N reaction as a test case von Galster, W., Leleux, P., Licot, I., Lienard, E., Lipnik, P., Mertens, D., Delbar, T., Vervier, J., Decrock, P., Huyse, M., Van Duppen, P., Duhamel, P., Vanhorenbeeck, J., Roters, G., Rolfs, C., Schroeder, U., Trautvetter, H. P., Wolke, K., Lambert, J., Rodney, W. S.

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Dislocation interactions and low-angle grain boundary strengthening von Liu, B., Raabe, D., Eisenlohr, P., Roters, F., Arsenlis, A., Hommes, G.

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DAMASK – The Düsseldorf Advanced Material Simulation Kit for modeling multi-physics crystal plasticity, thermal, and damage phenomena from the single crystal up to the component sc... von Roters, F., Diehl, M., Shanthraj, P., Eisenlohr, P., Reuber, C., Wong, S.L., Maiti, T., Ebrahimi, A., Hochrainer, T., Fabritius, H.-O., Nikolov, S., Friák, M., Fujita, N., Grilli, N., Janssens, K.G.F., Jia, N., Kok, P.J.J., Ma, D., Meier, F., Werner, E., Stricker, M., Weygand, D., Raabe, D.

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An FFT-based spectral solver for interface decohesion modelling using a gradient damage approach von Sharma, L., Peerlings, R. H. J., Shanthraj, P., Roters, F., Geers, M. G. D.

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Integral nonlocal approach to model interface decohesion in FFT solvers von Sharma, L., Peerlings, R.H.J., Geers, M.G.D., Roters, F.

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