Investigation of surface and sub-surface damage in high quality synthetic diamonds by X-ray reflectivity and grazing incidence in-plane diffraction von Bussone, Genziana, Lafford, Tamzin A., Masiello, Fabio, Gibaud, Alain, Carbone, Gerardina, Schülli, Tobias U., Connell, Simon H., Rommeveaux, Amparo Vivo, Wormington, Matthew, Härtwig, Jürgen

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Investigation of surface and sub-surface damage in high quality synthetic diamonds by X-ray reflectivity and grazing incidence in-plane diffraction : High-resolution X-ray Diffract... von BUSSONE, Genziana, LAFFORD, Tamzin A, MASIELLO, Fabio, GIBAUD, Alain, CARBONE, Gerardina, SCHÜLLI, Tobias U, CONNELL, Simon H, VIVO ROMMEVEAUX, Amparo, WORMINGTON, Matthew, HÄRTWIG, Jürgen

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Measurement techniques to improve the accuracy of x-ray mirror metrology using stitching Shack–Hartmann wavefront sensors von Adapa, Bharath Reddy, Dovillaire, Guillaume, Vivo, Amparo, Perrin, Francois, Mayer, Rafael, Barrett, Raymond

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Fabrication of ultrashort sub-meter-radius x-ray mirrors using dynamic stencil deposition with figure correction von Shimamura, Takenori, Takeo, Yoko, Kimura, Takashi, Perrin, François, Vivo, Amparo, Senba, Yasunori, Kishimoto, Hikaru, Ohashi, Haruhiko, Mimura, Hidekazu

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X‐ray mirrors with sub‐nanometre figure errors obtained by differential deposition of thin WSi2 films von Bras, Patrice, Morawe, Christian, Labouré, Sylvain, Perrin, François, Vivo, Amparo, Barrett, Raymond

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X‐ray mirror figure correction by differential deposition and off‐line metrology von Morawe, Christian, Labouré, Sylvain, Peffen, Jean-Christophe, Perrin, François, Vivo, Amparo, Barrett, Raymond

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DABAM: an open-source database of X-ray mirrors metrology von Sanchez del Rio, Manuel, Bianchi, Davide, Cocco, Daniele, Glass, Mark, Idir, Mourad, Metz, Jim, Raimondi, Lorenzo, Rebuffi, Luca, Reininger, Ruben, Shi, Xianbo, Siewert, Frank, Spielmann-Jaeggi, Sibylle, Takacs, Peter, Tomasset, Muriel, Tonnessen, Tom, Vivo, Amparo, Yashchuk, Valeriy

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A Fizeau interferometry stitching system to characterize X-ray mirrors with sub-nanometre errors von da Silva, Murilo B., Alcock, Simon G., Nistea, Ioana-Theodora, Sawhney, Kawal

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