Micro-stitching interferometry at the ESRF von Rommeveaux, Amparo, Barrett, Raymond

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Investigation of surface and sub-surface damage in high quality synthetic diamonds by X-ray reflectivity and grazing incidence in-plane diffraction von Bussone, Genziana, Lafford, Tamzin A., Masiello, Fabio, Gibaud, Alain, Carbone, Gerardina, Schülli, Tobias U., Connell, Simon H., Rommeveaux, Amparo Vivo, Wormington, Matthew, Härtwig, Jürgen

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An LTP stitching procedure with compensation of instrument errors: Comparison of SOLEIL and ESRF results on strongly curved mirrors von Polack, François, Thomasset, Muriel, Brochet, Sylvain, Rommeveaux, Amparo

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Investigation of surface and sub-surface damage in high quality synthetic diamonds by X-ray reflectivity and grazing incidence in-plane diffraction : High-resolution X-ray Diffract... von BUSSONE, Genziana, LAFFORD, Tamzin A, MASIELLO, Fabio, GIBAUD, Alain, CARBONE, Gerardina, SCHÜLLI, Tobias U, CONNELL, Simon H, VIVO ROMMEVEAUX, Amparo, WORMINGTON, Matthew, HÄRTWIG, Jürgen

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Global High-Accuracy Intercomparison of Slope Measuring Instruments von Siewert, Frank, Assoufid, Lahsen, Cocco, Daniele, Hignette, Olivier, Irick, Steve, Lammert, Heiner, McKinney, Wayne, Ohashi, Haruhiko, Polack, Francois, Qian, Shinan, Rah, Seungyu, Rommeveaux, Amparo, Schonherr, Veit, Sostero, Giovani, Takacs, Peter, Thomasset, Muriel, Yamauchi, Kazuto, Yashchuk, Valeriy, Zeschke, Thomas

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