A clustering algorithm for identifying multiple outliers in linear regression von Sebert, David M., Montgomery, Douglas C., Rollier, Dwayne A.

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A methodology of pattern recognition schemes for two variables in SPC von Chih, Wen-Hai, Rollier, Dwayne A

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Manufacturing communication: A review of the MMS approach von Shanmugham, Sengoda G., Beaumariage, Terrence G., Roberts, Chell A., Rollier, Dwayne A.

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Multiple response optimization using mixture-designed experiments and desirability functions in semiconductor scheduling von Dabbas, Russ M., Fowler, John W., Rollier, Dwayne A., Mccarville, Daniel

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Diagnostic Characteristics for Bivariate Pattern Recognition Scheme in SPC von Chih, Wenhai W, Rollier, Dwayne A

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A methodology of pattern recognition schemes for two variables inSPC von Chih, WenHai, Rollier, Dwayne A.

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Data Quality: Assessing Input Data Uncertainty in Life Cycle Assessment Inventory Models von Kennedy, Dale J., Montgomery, Douglas C., Rollier, Dwayne A., Keats, J. Bert

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Automatic Identification of Autoregressive Integrated Moving Average Time Series von Kang, Chin-Sheng Alan, Bedworth, David D., Rollier, Dwayne A.

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Stochastic cash flow evaluation under conditions of uncertain timing von Estes, John H., Moor, William C., Rollier, Dwayne A.

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Diagnostic Characteristics for Bivariate Pattern Recognition Scheme inSPC von Chih, Wenhai W., Rollier, Dwayne A.

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Modeling detection of incidents by drivers von Mussa, Renatus N., Matthias, Judson S., Upchurch, Jonathan E., Rollier, Dwayne A., Zaniewski, John P.

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Data Quality von Kennedy, Dale J, Montgomery, Douglas C, Rollier, Dwayne A, Keats, J. Bert

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