SIM-STEM Lab: Incorporating Compressed Sensing Theory for Fast STEM Simulation von Robinson, Alex W., Nicholls, Daniel, Wells, Jack, Moshtaghpour, Amirafshar, Kirkland, Angus, Browning, Nigel D.

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The advantages of sub-sampling and Inpainting for scanning transmission electron microscopy von Browning, Nigel D., Castagna, Jony, Kirkland, Angus I., Moshtaghpour, Amirafshar, Nicholls, Daniel, Robinson, Alex W., Wells, Jack, Zheng, Yalin

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Towards real‐time STEM simulations through targeted subsampling strategies von Robinson, Alex W., Wells, Jack, Nicholls, Daniel, Moshtaghpour, Amirafshar, Chi, Miaofang, Kirkland, Angus I., Browning, Nigel D.

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High-speed 4-dimensional scanning transmission electron microscopy using compressive sensing techniques von Robinson, Alex W, Moshtaghpour, Amirafshar, Wells, Jack, Nicholls, Daniel, Chi, Miaofang, MacLaren, Ian, Kirkland, Angus I, Browning, Nigel D

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Diffusion distribution model for damage mitigation in scanning transmission electron microscopy von Moshtaghpour, Amirafshar, Velazco‐Torrejon, Abner, Nicholls, Daniel, Robinson, Alex W., Kirkland, Angus I., Browning, Nigel D.

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Multi-Dimensional Data Restoration from Subsampled EBSD Data von Broad, Zoe, Wells, Jack, Nicholls, Daniel, Robinson, Alex W., Moshtaghpour, Amirafshar, Masters, Robert, Hughes, Louise, Kirkland, Angus I., Browning, Nigel D.

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Characterization of 2DEG on WG semiconductors through sub-sampled 4DSTEM von Nicotra, Giuseppe, Sfuncia, Gianfranco, Robinson W, Alex, Nicholls, Daniel, Wells, Jack, Mio M, Antonio, Bongiorno, Corrado, Bottari, Cettina, Adamo, Salvatore, Russo, Alfio, Alessandrino, Santi, Browning D, Nigel, Spinella, Corrado

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mathrm{SIM}$-$\mathrm{STEM}$ $\mathrm{Lab}$: Incorporating Compressed Sensing Theory for Fast STEM Simulation von Robinson, Alex W., Nicholls, Daniel, Wells, Jack, Moshtaghpour, Amirafshar, Kirkland, Angus, Browning, Nigel D.

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LoRePIE: $\ell_0$ Regularised Extended Ptychographical Iterative Engine for Low-dose and Fast Electron Ptychography von Moshtaghpour, Amirafshar, Velazco-Torrejon, Abner, Robinson, Alex W, Browning, Nigel D, Kirkland, Angus I

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Diffusion Distribution Model for Damage Mitigation in Scanning Transmission Electron Microscopy von Moshtaghpour, Amirafshar, Velazco-Torrejon, Abner, Nicholls, Daniel, Robinson, Alex W, Kirkland, Angus I, Browning, Nigel D

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SenseAI: Real-Time Inpainting for Electron Microscopy von Wells, Jack, Moshtaghpour, Amirafshar, Nicholls, Daniel, Robinson, Alex W, Zheng, Yalin, Castagna, Jony, Browning, Nigel D

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Compressive Electron Backscatter Diffraction Imaging von Broad, Zoë, Robinson, Alex W, Wells, Jack, Nicholls, Daniel, Moshtaghpour, Amirafshar, Kirkland, Angus I, Browning, Nigel D

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Scan Coil Dynamics Simulation for Subsampled Scanning Transmission Electron Microscopy von Nicholls, Daniel, Wells, Jack, Robinson, Alex W, Moshtaghpour, Amirafshar, Kirkland, Angus I, Browning, Nigel D

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Simultaneous High-Speed and Low-Dose 4-D STEM Using Compressive Sensing Techniques von Robinson, Alex W, Moshtaghpour, Amirafshar, Wells, Jack, Nicholls, Daniel, Chi, Miaofang, MacLaren, Ian, Kirkland, Angus I, Browning, Nigel D

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Subsampling Methods for Fast Electron Backscattered Diffraction Analysis von Broad, Zoë, Nicholls, Daniel, Wells, Jack, Robinson, Alex W, Moshtaghpour, Amirafshar, Masters, Robert, Hughes, Louise, Browning, Nigel D

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In silico Ptychography of Lithium-ion Cathode Materials from Subsampled 4-D STEM Data von Robinson, Alex W, Moshtaghpour, Amirafshar, Wells, Jack, Nicholls, Daniel, Broad, Zoe, Kirkland, Angus I, Mehdi, Beata L, Browning, Nigel D

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SIM-STEM Lab: Incorporating Compressed Sensing Theory for Fast STEM Simulation von Robinson, Alex W, Nicholls, Daniel, Wells, Jack, Moshtaghpour, Amirafshar, Kirkland, Angus I, Browning, Nigel D

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A Targeted Sampling Strategy for Compressive Cryo Focused Ion Beam Scanning Electron Microscopy von Nicholls, Daniel, Wells, Jack, Robinson, Alex W, Moshtaghpour, Amirafshar, Kobylynska, Maryna, Fleck, Roland A, Kirkland, Angus I, Browning, Nigel D

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The Potential of Subsampling and Inpainting for Fast Low-Dose Cryo FIB-SEM Imaging and Tomography von Nicholls, Daniel, Kobylysnka, Maryna, Wells, Jack, Broad, Zoe, Robinson, Alex W, McGrouther, Damien, Moshtaghpour, Amirafshar, Kirkland, Angus I, Fleck, Roland A, Browning, Nigel D

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LoRePIE: \(\ell_0\) Regularised Extended Ptychographical Iterative Engine for Low-dose and Fast Electron Ptychography von Moshtaghpour, Amirafshar, Velazco-Torrejon, Abner, Robinson, Alex W, Browning, Nigel D, Kirkland, Angus I

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