Impact of Coronavirus Disease 2019 Restrictions on Retinal Detachment: A Multicenter Experience von Jung, Jesse J., Chang, Jonathan S., Oellers, Patrick R., Ali, Mohsin H., Do, Brian K., Tseng, Joseph J., Roizenblatt, Roberto, Muni, Rajeev H., Weng, Christina Y., Oakey, Zackery B., Tsao, Sean W., Rofagha, Soraya, Chan, Xavier, Hoang, Quan V., Russ Richardson, Daniel, Toledo-Corral, Jaime, Pandya, Hemang K., Copeland, Victor T., Jonna, Gowtham, Zahid, Sarwar, Lin, James, Thanos, Aristomenis, Ezon, Isaac, Movahedan, Asadolah, Schechet, Sidney A., Mehta, Mitul C., Hamli, Hesham, Puri, Sidharth, Jhaveri, Chirag D., Ridgeley, Jamison R., Sheyman, Alan T., Hu, Jonathan, Lu, Stephanie Y., Browne, Andrew W., Huang, Lynn L., Chee, Yewlin E., Elmann, Solly, Chaudhary, Khurram M., Mehta, Nitish, Kurochkin, Philip, Gjyzeli, Genti, Altaweel, Michael M., Michael Nork, T., Zeng, Anne, Loh, Isabella Q., Yi Lin, Hong

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Normal incidence spectrometers for the extreme ultraviolet using blazed multilayer coated diffraction gratings von Ridgeley, A.

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Blaze considerations for multilayer gratings von Ridgeley, A.

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Testing IR flux during solar eclipse von Ridgeley, A, Sheen, B, Grayer, G, Mehmet, D

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Andrew Ridgeley "Shake"

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An Elliptical Crystal Spectrometer Suitable for EXAFS Studies of Laser Compressed Materials and for High Resolution X-Ray Spectroscopy von Ridgeley, A., Goodman, D., Hall, T. A.

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An elliptical crystal spectrometer suitable for EXAFS studies of laser compressed materials and for high resolution x-ray spectroscopy von Ridgeley, A., Goodman, D., Hall, T.A.

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Intensity measurements of a quasi-monochromatic X-ray beam formed by a spherically bent crystal von Rodé, A.V., Maksimchuk, A.M., Sklizkov, G.V., Ridgeley, A., Danson, C., Rizvi, N., Bann, R., Forster, E., Uschmann, I.

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The Spectrum ArIX and Extended Spectral Classification in ArV to ArVIII and ArX von Fawcett, B C, Ridgeley, A, Bromage, G E

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Solar Limb and Disk Continuum Intensities in the Wavelength Region 1450–1950 Å von Jordan, C., Ridgeley, A.

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An investigation of the X-ray point-source brightness for a short-pulse laser plasma von Tallents, G.J., Key, M.H., Ridgeley, A., Shaikh, W., Lewis, C.L.S., O'Neill, D., Davidson, S.J., Freeman, N.J., Perkins, D.

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The solar limb emission spectrum between 300 and 2803 von Burton, W.M., Ridgeley, A.

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Development and applications of monochromatic x‐ray imaging von Ridgeley, A.

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Line classifications for Ni XXV and XXVI and new observations of Fe XXIII and XXIV in laser-produced spectra von Fawcett, B. C., Ridgeley, A., Hughes, T. P.

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Photographic sensitivity measurements in the vacuum ultraviolet von Burton, W M, Hatter, A T, Ridgeley, A

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Soft X-Ray Contact Microscopy of Biological Specimens: Aluminum-Coated Silicon Nitride Windows as XUV Filters von Stead, A. D., Ford, T. W., Catcheside, J. A., Hills, C. P., Ridgeley, A.

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Classification of Resonance Transitions in Co VIII, Ni IX and Cu X von Fawcett, B C, Ridgeley, A, Ekberg, J O

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A pinhole camera for monochromatic x-ray imaging von Cole, A.J., Key, M.H., Ridgeley, A., Brown, D.A., Norreys, P.A., Wooding, E.R., Barbee, T.W.

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Analysis of n=3 to n=4 spectra for ions from Mg X to Fe XXIV and P XI, XII von Fawcett, B C, Ridgeley, A

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Measurement of X-Ray Spectral Line Wavelengths by Using Two Bragg Reflections von Rodé, A. V., Maksimchuk, A. M., Sklizkov, G. V., Ridgeley, A., Danson, C., Rizvi, N., Bann, R., Forster, E., Goetz, K., Uschmann, I.

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