Real-time localization of single C60 impacts with correlated secondary ion detection von Eller, M. J., Verkhoturov, S. V., Della-Negra, S., Rickman, R. D., Schweikert, E. A.

Volltext

Influence of massive projectile size and energy on secondary ion yields from organic surfaces von Guillermier, C., Negra, S. Della, Rickman, R.D., Pinnick, V., Schweikert, E.A.

Volltext

Simultaneous ejection of two molecular ions from keV gold atomic and polyatomic projectile impacts von Rickman, R D, Verkhoturov, S V, Parilis, E S, Schweikert, E A

Volltext

Statistics of electron and ion emission from single massive cluster impacts von Verkhoturov, S. V., Eller, M. J., Della-Negra, S., Rickman, R. D., Locklear, J. E., Schweikert, E. A.

Volltext

Molecular ion emission from single large cluster impacts von Verkhoturov, S.V., Rickman, R.D., Guillermier, C., Hager, G.J., Locklear, J.E., Schweikert, E.A.

Volltext

Single Impacts of C 60 on Solids: Emission of Electrons, Ions and Prospects for Surface Mapping von Verkhoturov, S. V., Eller, M. J., Rickman, R. D., Della-Negra, S., Schweikert, E. A.

Volltext

Single Impacts of C60 on Solids: Emission of Electrons, Ions and Prospects for Surface Mapping von Verkhoturov, S. V, Eller, M. J, Rickman, R. D, Della-Negra, S, Schweikert, E. A

Volltext

Layer-by-layer characterization of ultrathin films with secondary ion mass spectrometry von Li, Z., Rickman, R.D., Verkhoturov, S.V., Schweikert, E.A.

Volltext

Nanodomain analysis via coincidence ion mass spectrometry von Verkhoturov, S.V., Rickman, R.D., Balderas, S., Schweikert, E.A.

Volltext

Characterization of surface structure by cluster coincidental ion mass spectrometry von Rickman, R.D., Verkhoturov, S.V., Balderas, S., Bestaoui, N., Clearfield, A., Schweikert, E.A.

Volltext

Real‐time localization of single C 60 impacts with correlated secondary ion detection von Eller, M. J., Verkhoturov, S. V., Della‐Negra, S., Rickman, R. D., Schweikert, E. A.

Volltext

Multi-ion emission from large and massive keV cluster impacts von Rickman, R.D., Verkhoturov, S.V., Hager, G.J., Schweikert, E.A.

Volltext

Cluster secondary ion mass spectrometry: an insight into “super-efficient” collision cascades von Rickman, Richard D., Verkhoturov, Stanislav V., Schweikert, Emile A.

Volltext

Characterization of environmental exposure to mineral sands by PDMS technique von Dias da Cunha, K., Rickman, R.D., Barros Leite, C.V.

Volltext

Prompt in situ emission of gold adducts from single impacts of large gold clusters on organics solids von Guillermier, C., Negra, S. Della, Rickman, R.D., Hager, G.J., Schweikert, E.A.

Volltext

Multiple secondary ion emission from keV massive gold projectile impacts von Rickman, R.D., Verkhoturov, S.V., Hager, G.J., Schweikert, E.A., Bennett, J.A.

Volltext

Natural Abundances of Carbon Isotopes (14C, 13C) in Lichens and Calcium Oxalate Pruina: Implications for Archaeological and Paleoenvironmental Studies von Beazley, Melanie J, Rickman, Richard D, Ingram, Debra K, Boutton, Thomas W, Russ, Jon

Volltext

Layer-by-layer characterization of ultrathin films with secondary ion mass spectrometry von LI, Z, RICKMAN, R. D, VERKHOTUROV, S. V, SCHWEIKERT, E. A

Volltext

Characterization of surface structure by cluster coincidental ion mass spectrometry von RICKMAN, R. D, VERKHOTUROV, S. V, BALDERAS, S, BESTAOUI, N, CLEARFIELD, A, SCHWEIKERT, E. A

Volltext

Nanodomain analysis via coincidence ion mass spectrometry von VERKHOTUROV, S. V, RICKMAN, R. D, BALDERAS, S, SCHWEIKERT, E. A

Volltext