Measurement and causal modelling of twisted pair copper cables von Yoho, Jason J., Riad, Sedki M., Muqaibel, Ali H.

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TFDTLM-a new computationally efficient frequency-domain transmission-line-matrix method von Salama, I., Riad, S.M.

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Fork-Coupled Resonators for High-Frequency Characterization of Dielectric Substrate Materials von Muqaibel, A.H., Safaai-Jazi, A., Riad, S.M.

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Crosstalk analysis of multisection multiconductor lines von Su, W., Riad, S.M., Elshabini-Raid, A., Poulin, T.

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Dielectric loss determination using perturbation von Andrawis, M.Y., Davis, W.A., Riad, S.M., Elshabini-Riad, A.

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A time-domain approach for wideband modeling of electronic packages von Riad, Sedki M., Salama, Iman, Bhutta, Imran, Su, Wansheng

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The deconvolution problem: An overview von Riad, S.M.

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Novel technique for estimating metal semiconductor field effect transitor parasitics von Khalaf, Yaser A., Riad, Sedki M.

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Analysis and design of ferrite cores for eddy-current-killed oscillator inductive proximity sensors von Anim-Appiah, K.D., Riad, S.M.

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Filtering capabilities and convergence of the Van-Cittert deconvolution technique von Bennia, A., Riad, S.M.

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An optimization technique for iterative frequency-domain deconvolution von Bennia, A., Riad, S.M.

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Calibration of time domain network analyzers von Su, W., Riad, S.M.

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Modeling of the HP-1430A feedthrough wide-band (28-ps) sampling head von Riad, S. M.

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Study and Performance Evaluation of Two Iterative Frequency-Domain Deconvolution Techniques von Parruck, Bidyut, Riad, Sedki M.

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Circuit structure including RF/wideband resonant vias von RIAD, SEDKI M

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A new time-domain approach for determining the complex permittivity using stripline geometry von Fidanboylu, K.M., Riad, S.M., Elshabini-Riad, A.

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Computing the complete fft of a step-like waveform von Shaarawi, Amr M., Riad, Sedki M.

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An Optimization Criterion for Iterative Deconvolution von Parruck, Bidyut, Riad, Sedki M.

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Bond verification of space shuttle tiles using time-domain techniques von Bennia, A., Wangsheng Su, Riad, S.M.

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Wide-band characterization of multilayer thick film structures using a time-domain technique von Toscano, J.C., Elshabini-Riad, A., Riad, S.M., Al-Mazroo, A.Y.

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