Influence of the oxygen partial pressure on the growth and optical properties of RF-sputtered anatase TiO2 thin films von Korpi, A.R. Grayeli, Rezaee, Sahare, Luna, C., Ţălu, Ş., Arman, A., Ahmadpourian, A.

Volltext

The effects of deposition time on surface morphology, structural, electrical and optical properties of sputtered Ag-Cu thin films von Ahmadpourian, Azin, Luna, Carlos, Boochani, Arash, Arman, Ali, Achour, Amine, Rezaee, Sahare, Naderi, Sirvan

Volltext

Analyzing the fractal feature of nickel thin films surfaces modified by low energy nitrogen ion: Determination of micro‐morphologies by atomic force microscopy (AFM) von Ţălu, Ştefan, Yadav, Ram Pratap, Ali, Arman, Alireza Grayeli Korpi, Sobola, Dinara, Ţălu, Mihai, Rezaee, Sahare, Achour, Amine, Jurečka, Stanislav, Mardani, Mohsen

Volltext

Analyzing the fractal feature of nickel thin films surfaces modified by low energy nitrogen ion von Ţălu, Ştefan, Yadav, Ram Pratap, Arman, Ali, Korpi, Alireza Grayeli, Sobola, Dinara, Ţălu, Mihai, Rezaee, Sahare, Achour, Amine, Jurečka, Stanislav, Mardani, Mohsen

Volltext

Analyzing the fractal feature of nickel thin films surfaces modified by low energy nitrogen ion: Determination of micro‐morphologies by atomic force microscopy (AFM) von Ţălu, Ştefan, Yadav, Ram Pratap, Arman, Ali, Korpi, Alireza Grayeli, Sobola, Dinara, Ţălu, Mihai, Rezaee, Sahare, Achour, Amine, Jurečka, Stanislav, Mardani, Mohsen

Volltext