Polymer-based scattering layers for internal light extraction from organic light emitting diodes von Riedel, Daniel, Wehlus, Thomas, Reusch, Thilo C.G., Brabec, Christoph J.

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Functional Interfaces for Transparent Organic Electronic Devices: Consistent Description of Charge Injection by Combining In Situ XPS and Current Voltage Measurements with Self-Con... von Gassmann, Jürgen, Yampolskii, Sergey V, Genenko, Yuri A, Reusch, Thilo C.G, Klein, Andreas

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Passive cooling of large-area organic light-emitting diodes von Schwamb, Philipp, Reusch, Thilo C.G., Brabec, Christoph J.

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Extraction of surface plasmons in organic light-emitting diodes via high-index coupling von Scholz, Bert J, Frischeisen, Jörg, Jaeger, Arndt, Setz, Daniel S, Reusch, Thilo C G, Brütting, Wolfgang

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Combined Electrical and Optical Analysis of the Efficiency Roll-Off in Phosphorescent Organic Light-Emitting Diodes von Wehrmeister, Sebastian, Jäger, Lars, Wehlus, Thomas, Rausch, Andreas F., Reusch, Thilo C. G., Schmidt, Tobias D., Brütting, Wolfgang

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Investigation of energy transfer mechanisms between two adjacent phosphorescent emission layers von Diez, Carola, Reusch, Thilo C. G., Seidel, Stefan, Brütting, Wolfgang

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Highly stable charge generation layers using caesium phosphate as n-dopants and inserting interlayers von Diez, Carola, Reusch, Thilo C. G., Lang, Erwin, Dobbertin, Thomas, Brütting, Wolfgang

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Realization of Atomically Controlled Dopant Devices in Silicon von Rueß, Frank J., Pok, Wilson, Reusch, Thilo C. G., Butcher, Matthew J., Goh, Kuan Eng J., Oberbeck, Lars, Scappucci, Giordano, Hamilton, Alex R., Simmons, Michelle Y.

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Extracting the emitter orientation in organic light-emitting diodes from external quantum efficiency measurements von Schmidt, Tobias D., Reichardt, Lukas J., Rausch, Andreas F., Wehrmeister, Sebastian, Scholz, Bert J., Mayr, Christian, Wehlus, Thomas, Ciarnáin, Rossá Mac, Danz, Norbert, Reusch, Thilo C. G., Brütting, Wolfgang

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Imaging of buried phosphorus nanostructures in silicon using scanning tunneling microscopy von Oberbeck, Lars, Reusch, Thilo C. G., Hallam, Toby, Schofield, Steven R., Curson, Neil J., Simmons, Michelle Y.

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Single Phosphorus Atoms in Si(001):  Doping-Induced Charge Transfer into Isolated Si Dangling Bonds von Reusch, Thilo C. G, Radny, Marian W, Smith, Phillip V, Warschkow, Oliver, Marks, Nigel A, Curson, Neil J, McKenzie, David R, Simmons, Michelle Y

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Electrical Characterization of Ordered Si:P Dopant Arrays von Pok, W., Reusch, T.C.G., Scappucci, G., Rueb, F.J., Hamilton, A.R., Simmons, M.Y.

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Demonstration of gating action in atomically controlled Si:P nanodots defined by scanning probe microscopy von Rueß, Frank J., Scappucci, Giordano, Füchsle, Martin, Pok, Wilson, Fuhrer, Andreas, Thompson, Daniel L., Reusch, Thilo C.G., Simmons, Michelle Y.

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Surface gate and contact alignment for buried, atomically precise scanning tunneling microscopy–patterned devices von Fuechsle, Martin, Rueß, Frank J., Reusch, Thilo C. G., Mitic, Mladen, Simmons, Michelle Y.

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Atomically precise silicon device fabrication von Simmons, M.Y., Ruess, F.J., Pok, W., Thompson, D.L., Fuchsle, M., Scappucci, G., Reusch, T.C.G., Goh, K.-E.J., Schofield, S.R., Weber, B., Oberbeck, L., Hamilton, A.R., Ratto, F.

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Comprehensive efficiency analysis of organic light-emitting diodes featuring emitter orientation and triplet-to-singlet up-conversion von Schmidt, Tobias D., Setz, Daniel S., Flämmich, Michael, Frischeisen, Jörg, Michaelis, Dirk, Mayr, Christian, Rausch, Andreas F., Wehlus, Thomas, Scholz, Bert J., Reusch, Thilo C. G., Danz, Norbert, Brütting, Wolfgang

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