The effect of interfaces on electronic switching in VO2 thin films von Remke, R.L., Walser, R.M., Bené, R.W.

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Transition layers between VO2 films and oxide substrates von Remke, R.L., Walser, R.M., Bené, R.W.

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The effect of interfaces on electronic switching in VO 2 thin films von Remke, R.L., Walser, R.M., Bené, R.W.

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SEU measurements on HFETs and HFET SRAMs von Remke, R.L., Witmer, S.B., Jones, S.D.F., Barber, F.E., Flesner, L.D., O'Brien, M.E.

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Characteristics of GaAs heterojunction FETs (HFETs) and source follower FET logic (SFFL) inverters exposed to high energy neutrons von Janousek, B.K., Krantz, R.J., Bloss, W.L., Yamada, W.E., Brown, S., Remke, R.L., Witmer, S.

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Transition layers between VO 2 films and oxide substrates von Remke, R.L., Walser, R.M., Bené, R.W.

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Characteristics of GaAs heterojunction FETs (HFETs) and source follower FET logic (SFFL) inverters exoposed to high energy neutrons von Janousek, B.K., Krantz, R.J., Bloss, W.L., Yamada, W.E., Brown, S., Remke, R.L., Witmer, S.

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Mineralogy and Magnetic Properties of Basaltic Substrate Soils: Kaho'olawe and Big Island, Hawaii von Van Dam, R.L, Harrison, J.B.J, Hirschfeld, D.A, Meglich, T.M, Li, Y, North, R.E

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