New Special Standards of the Frequency Deviation Unit and the Amplitude Modulation Coefficient Unit von Ballo, V L, Dobrovol'skii, V B, Zen'kovich, A V, Rekshinskii, V A

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Flicker noise in ion-implanted silicon structures von Makoviychuk, M.I., Parshin, E.O., Rekshinskii, V.A.

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Sheet resistance and noise properties of ion-implanted silicon structures von VALOV, A. N, MAKOVIICHUK, M. I, REKSHINSKII, V. A

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Effects of low-temperature diffusion on the electrophysical properties of Cu-Cr polycor structures von Bogdanovich, O. O., Kuznetsov, L. A., Orlov, O. S., Rekshinskii, V. A., Uskov, V. A.

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